| Paper Abstract and Keywords |
| Presentation |
2015-08-11 11:40
Effect of surface adsorbate on chemical shifts of core-level spectra for silicon oxinitride film Takahiro Takami, Makoto Wada, Yoshiharu Enta (Hirosaki Univ.) CPM2015-45 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
For silicon oxynitride (SiON) layers formed under specific conditions, unusual core-level spectra, which have large chemical shifts compared with normal spectra for SiON or SiO2 layers, have been observed in XPS measurements. To clarify the origin of the unusual chemical shifts, effects of sample bias and surface adsorbates on the chemical shifts were investigated. When the sample was biased positively, the unusual chemical-shift component moved toward normal value and consequently overlapped with the normal component. Furthermore, when a monolayer of Cs metal was deposited on the surface, the chemical-shift components showed the same behavior as the positively biased sample. Therefore, we consider that the unusual chemical shifts observed in this study are due to partially charged regions in SiON layers. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Silicon Oxynitride / Core-Level Chemical Shift / Charging / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 115, no. 179, CPM2015-45, pp. 71-74, Aug. 2015. |
| Paper # |
CPM2015-45 |
| Date of Issue |
2015-08-03 (CPM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
CPM2015-45 |
| Conference Information |
| Committee |
CPM |
| Conference Date |
2015-08-10 - 2015-08-11 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
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| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
CPM |
| Conference Code |
2015-08-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Effect of surface adsorbate on chemical shifts of core-level spectra for silicon oxinitride film |
| Sub Title (in English) |
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| Keyword(1) |
Silicon Oxynitride |
| Keyword(2) |
Core-Level Chemical Shift |
| Keyword(3) |
Charging |
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| 1st Author's Name |
Takahiro Takami |
| 1st Author's Affiliation |
Hirosaki University (Hirosaki Univ.) |
| 2nd Author's Name |
Makoto Wada |
| 2nd Author's Affiliation |
Hirosaki University (Hirosaki Univ.) |
| 3rd Author's Name |
Yoshiharu Enta |
| 3rd Author's Affiliation |
Hirosaki University (Hirosaki Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2015-08-11 11:40:00 |
| Presentation Time |
20 minutes |
| Registration for |
CPM |
| Paper # |
CPM2015-45 |
| Volume (vol) |
vol.115 |
| Number (no) |
no.179 |
| Page |
pp.71-74 |
| #Pages |
4 |
| Date of Issue |
2015-08-03 (CPM) |