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| Presentation | 2015-10-09 11:55 Evaluation and Analysis of Nb/Al/AlOx/Al/Nb Junctions Mizuki Ikeya (UEC), Takafumi Kojima, Noguchi Takashi (NAOJ), Takeshi Sakai (UEC)  SCE2015-34 Link to ES Tech. Rep. Archives: SCE2015-34 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We are developing an ultra-wideband receiver for upgrading ALMA (Atacama Large Millimeter/submillimeter Array) receivers. In the development, Superconductor/Insulator/Superconductor (SIS) mixer with high critical current density is most important component. However it is difficult to fabricate it so that an insulator layer is very thin and likely to be with defects. In conventional structure Nb/Al/AlOx/Nb, leakage current could be increased by producing lower Nb Oxide on insulator when sputtering counter Nb layer. So Nb/Al/AlOx/Al/Nb junctions are adopted to reduce leakage current. The measured I-V characteristics showed that leakage current of the junction with an upper Al layer was small when compared to the junction without the upper Al layer. The gap voltage and leakage current degraded as the increase of thickness of the upper Al layer. Analysis about leakage current by fitting I-V characteristics are reported. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | SIS Junctions / Niobium / Al / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 242, SCE2015-34, pp. 75-79, Oct. 2015. | |
| Paper # | SCE2015-34 | |
| Date of Issue | 2015-10-01 (SCE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SCE2015-34 Link to ES Tech. Rep. Archives: SCE2015-34 |
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| Conference Information | |
| Committee | SCE |
| Conference Date | 2015-10-08 - 2015-10-09 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Tohoku Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | SCE |
| Conference Code | 2015-10-SCE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation and Analysis of Nb/Al/AlOx/Al/Nb Junctions |
| Sub Title (in English) | |
| Keyword(1) | SIS Junctions |
| Keyword(2) | Niobium |
| Keyword(3) | Al |
| Keyword(4) | |
| Keyword(5) | |
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| Keyword(8) | |
| 1st Author's Name | Mizuki Ikeya |
| 1st Author's Affiliation | The University of Electro-Communications (UEC) |
| 2nd Author's Name | Takafumi Kojima |
| 2nd Author's Affiliation | National Astronomical Observatory of Japan (NAOJ) |
| 3rd Author's Name | Noguchi Takashi |
| 3rd Author's Affiliation | National Astronomical Observatory of Japan (NAOJ) |
| 4th Author's Name | Takeshi Sakai |
| 4th Author's Affiliation | The University of Electro-Communications (UEC) |
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| Speaker | Author-1 |
| Date Time | 2015-10-09 11:55:00 |
| Presentation Time | 25 minutes |
| Registration for | SCE |
| Paper # | SCE2015-34 |
| Volume (vol) | vol.115 |
| Number (no) | no.242 |
| Page | pp.75-79 |
| #Pages | 5 |
| Date of Issue | 2015-10-01 (SCE) |
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