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Paper Abstract and Keywords
Presentation 2015-10-23 11:10
[Invited Talk] Analysis of magnetic devices by spin-polarized scanning electron microscopy -- Microscopic Magnetization Measurements using Spin Polarization of Electrons --
Teruo Kohashi (Hitachi) MR2015-21
Abstract (in Japanese) (See Japanese page) 
(in English) Spin-Polarized Scanning Electron Microscopy (Spin SEM) is one way for observing magnetic domain structures taking advantage of the spin polarization of the secondary electrons emitted from a ferromagnetic sample. This principle brings us several excellent capabilities such as high-spatial resolution better than 10 nm, and analysis of magnetization direction in three dimensions. In this paper, the principle and the structure of the spin SEM is briefly introduced, and some examples of the spin SEM measurements are shown.
Keyword (in Japanese) (See Japanese page) 
(in English) spin / magnetic domain / secondary electron / scanning electron microscopy / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, Oct. 2015.
Paper #  
Date of Issue 2015-10-15 (MR) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Notes on Review This article is a technical report without peer review, and its polished version will be published elsewhere.
Download PDF MR2015-21

Conference Information
Committee MRIS ITE-MMS  
Conference Date 2015-10-22 - 2015-10-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Recording Head, Spintronics, etc 
Paper Information
Registration To MRIS 
Conference Code 2015-10-MR-MMS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of magnetic devices by spin-polarized scanning electron microscopy 
Sub Title (in English) Microscopic Magnetization Measurements using Spin Polarization of Electrons 
Keyword(1) spin  
Keyword(2) magnetic domain  
Keyword(3) secondary electron  
Keyword(4) scanning electron microscopy  
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1st Author's Name Teruo Kohashi  
1st Author's Affiliation Hitachi, Ltd. (Hitachi)
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Speaker Author-1 
Date Time 2015-10-23 11:10:00 
Presentation Time 50 minutes 
Registration for MRIS 
Paper # MR2015-21 
Volume (vol) vol.115 
Number (no) no.263 
Page pp.37-41 
#Pages 5 
Date of Issue 2015-10-15 (MR) 

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