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| Presentation | 2015-10-30 13:00 [Special Talk] Radiation Hardness of Wide Bandgap Semiconductors Mitsuaki Yano (OIT)  SANE2015-43 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Space radiation environments provide the cumulative degradation by total-dose effects and displacement damage effects as well as the soft-errors by single-event effects. In this presentation, our experimental results are reported focusing on the displacement damage effects for wide bandgap semiconductors of GaN and ZnO. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Semiconductor / Radiation Hardness / Displacement Damage / Degradation Analysis / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 115, no. 282, SANE2015-43, pp. 13-14, Oct. 2015. | |
| Paper # | SANE2015-43 | |
| Date of Issue | 2015-10-23 (SANE) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SANE2015-43 |
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| Conference Information | |
| Committee | SANE |
| Conference Date | 2015-10-30 - 2015-10-30 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | OIT UMEKITA Knowledge Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Radar signal processing and general issues |
| Paper Information | |
| Registration To | SANE |
| Conference Code | 2015-10-SANE |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Radiation Hardness of Wide Bandgap Semiconductors |
| Sub Title (in English) | |
| Keyword(1) | Semiconductor |
| Keyword(2) | Radiation Hardness |
| Keyword(3) | Displacement Damage |
| Keyword(4) | Degradation Analysis |
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| 1st Author's Name | Mitsuaki Yano |
| 1st Author's Affiliation | Osaka Institute of Technology (OIT) |
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| Speaker | Author-1 |
| Date Time | 2015-10-30 13:00:00 |
| Presentation Time | 50 minutes |
| Registration for | SANE |
| Paper # | SANE2015-43 |
| Volume (vol) | vol.115 |
| Number (no) | no.282 |
| Page | pp.13-14 |
| #Pages | 2 |
| Date of Issue | 2015-10-23 (SANE) |
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