Paper Abstract and Keywords |
Presentation |
2016-01-21 11:10
Evaluation of various memory cells designed for SFQ mask ROM Kazunao Sawada, Tomoki Watanabe (UEC), Hiroshi Shimada, Yoshinao Mizugaki (UEC/JST) SCE2015-40 Link to ES Tech. Rep. Archives: SCE2015-40 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We developed memory cells for an SFQ mask ROM that will be implemented with an SFQ-D/A converter, a candidate of next-generation AC voltage standards. The area occupancy of the SFQ mask ROM is required to be small enough for implementation on the same chip with the SFQ-D/A converter. We had first designed and tested SFQ ROM cells using an existing library. Although they worked correctly, we found that the cell sizes were large, not acceptable for high-density integration. Hence, we developed small ROM cells dedicated for the SFQ mask ROM. The cell areas are 65% reduced by eliminating verbose elements and unused spaces. We have measured test circuits fabricated using a Nb integration technology, and confirmed that the bias margins are almost the same magnitude as the simulation results. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Mask ROM / Single Flux Quantum / Josephson effect / Superconducting integrated circuits / NbAlO2/Nb / / / |
Reference Info. |
IEICE Tech. Rep., vol. 115, no. 412, SCE2015-40, pp. 23-28, Jan. 2016. |
Paper # |
SCE2015-40 |
Date of Issue |
2016-01-14 (SCE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SCE2015-40 Link to ES Tech. Rep. Archives: SCE2015-40 |
Conference Information |
Committee |
SCE |
Conference Date |
2016-01-21 - 2016-01-21 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
SCE |
Conference Code |
2016-01-SCE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Evaluation of various memory cells designed for SFQ mask ROM |
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Keyword(1) |
Mask ROM |
Keyword(2) |
Single Flux Quantum |
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Josephson effect |
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Superconducting integrated circuits |
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NbAlO2/Nb |
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1st Author's Name |
Kazunao Sawada |
1st Author's Affiliation |
University of Electro-Communications (UEC) |
2nd Author's Name |
Tomoki Watanabe |
2nd Author's Affiliation |
University of Electro-Communications (UEC) |
3rd Author's Name |
Hiroshi Shimada |
3rd Author's Affiliation |
University of Electro-Communications/Japan Science and Technology Agency (UEC/JST) |
4th Author's Name |
Yoshinao Mizugaki |
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University of Electro-Communications/Japan Science and Technology Agency (UEC/JST) |
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Speaker |
Author-1 |
Date Time |
2016-01-21 11:10:00 |
Presentation Time |
25 minutes |
Registration for |
SCE |
Paper # |
SCE2015-40 |
Volume (vol) |
vol.115 |
Number (no) |
no.412 |
Page |
pp.23-28 |
#Pages |
6 |
Date of Issue |
2016-01-14 (SCE) |