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Paper Abstract and Keywords
Presentation 2016-02-17 14:25
Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding
Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92
Abstract (in Japanese) (See Japanese page) 
(in English) Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage with short test time since BIST relies on pseudo random patterns. This paper presents a method to combine LFSR reseeding with weighted random pattern testing BIST (WRBIST) to achieve high fault coverage with short test time and small test data volume. Conventional WRBIST uses multiple weight sets to achieve high fault coverage instead of changing LFSR seed. In contrast, the proposed WRBIST uses a xed weight to save test data volume and does reseeding to improve fault coverage. Experimental results show that the proposed method can achieve higher fault coverage with short test time compared to conventional LFSR reseeding and WRBIST.
Keyword (in Japanese) (See Japanese page) 
(in English) BIST / STUMPS / LFSR / Reseeding / Weighted random pattern / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 449, DC2015-92, pp. 37-42, Feb. 2016.
Paper # DC2015-92 
Date of Issue 2016-02-10 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2016-02-17 - 2016-02-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2016-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding 
Sub Title (in English)  
Keyword(1) BIST  
Keyword(2) STUMPS  
Keyword(3) LFSR  
Keyword(4) Reseeding  
Keyword(5) Weighted random pattern  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Sayaka Satonaka  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Tomokazu Yoneda  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Yuta Yamato  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Michiko Inoue  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2016-02-17 14:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2015-92 
Volume (vol) vol.115 
Number (no) no.449 
Page pp.37-42 
#Pages 6 
Date of Issue 2016-02-10 (DC) 

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