| Paper Abstract and Keywords |
| Presentation |
2016-06-29 16:20
[Invited Lecture]
Self-assembled monolayer-based gate dielectrics for low voltage MoS2 FET Takamasa Kawanago, Shunri Oda (Tokyo Tech.) SDM2016-45 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In this study, self-assembled-monolayer (SAM)-based gate dielectrics is applied to the fabrication of molybdenum disulfide (MoS2) field-effect transistors (FETs). The gate dielectrics consist of plasma-oxidized aluminum oxides (AlOx) and a SAM. 2-voltage operational MoS2 FETs were demonstrated with the ultrathin SAM-based gate dielectrics. Furthermore, a subthreshold slope (SS) of 69 mV/dec and no hysteresis were observed. The small SS and no hysteresis in Id–Vg characteristics indicate the superior interfacial properties of the MoS2/SAM structure. The SAM-based gate dielectrics are found to be applicable to the fabrication of low-voltage MoS2 FETs. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Self-assembled monolayer / Molybdenum disulfide / Field-effect transistors / Interfacial properties / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 116, no. 118, SDM2016-45, pp. 69-74, June 2016. |
| Paper # |
SDM2016-45 |
| Date of Issue |
2016-06-22 (SDM) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
SDM2016-45 |
| Conference Information |
| Committee |
SDM |
| Conference Date |
2016-06-29 - 2016-06-29 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Campus Innovation Center Tokyo |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Material Science and Process Technology for MOS Devices and Memories |
| Paper Information |
| Registration To |
SDM |
| Conference Code |
2016-06-SDM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Self-assembled monolayer-based gate dielectrics for low voltage MoS2 FET |
| Sub Title (in English) |
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| Keyword(1) |
Self-assembled monolayer |
| Keyword(2) |
Molybdenum disulfide |
| Keyword(3) |
Field-effect transistors |
| Keyword(4) |
Interfacial properties |
| Keyword(5) |
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| 1st Author's Name |
Takamasa Kawanago |
| 1st Author's Affiliation |
Tokyo Institute of Technology (Tokyo Tech.) |
| 2nd Author's Name |
Shunri Oda |
| 2nd Author's Affiliation |
Tokyo Institute of Technology (Tokyo Tech.) |
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| Speaker |
Author-1 |
| Date Time |
2016-06-29 16:20:00 |
| Presentation Time |
20 minutes |
| Registration for |
SDM |
| Paper # |
SDM2016-45 |
| Volume (vol) |
vol.116 |
| Number (no) |
no.118 |
| Page |
pp.69-74 |
| #Pages |
6 |
| Date of Issue |
2016-06-22 (SDM) |