| Paper Abstract and Keywords |
| Presentation |
2016-07-08 14:55
[Invited Talk]
Atomic switch-type resistance change memory based on cation transport in oxide thin films Tohru Tsuruoka (NIMS) MR2016-17 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We have investigated the switching mechanism and functionalities of Cu,Ag/Ta2O5/Pt atomic switch-type resistance change memories based on the transport of metal ions in oxide thin films and electrochemical reactions at metal/oxide interfaces. We proposed the operation model and confirmed the validity of our model. The effects of moisture absorption in the oxide matrix and of redox reactions at Ag,Cu/Ta2O5 interfaces on the switching characteristics are discussed. As the unique function of atomic switches, the conductance quantization and synaptic behavior are also demonstrated. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
oxide / cation transport / redox reaction / Moisture absorption / conductance quantization / synaptic behavior / / |
| Reference Info. |
IEICE Tech. Rep., vol. 116, July 2016. |
| Paper # |
|
| Date of Issue |
2016-07-01 (MR) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
MR2016-17 |
| Conference Information |
| Committee |
MRIS ITE-MMS |
| Conference Date |
2016-07-08 - 2016-07-08 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Chuo Univ. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Solid State Memory, Media, etc. |
| Paper Information |
| Registration To |
MRIS |
| Conference Code |
2016-07-MR-MMS |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Atomic switch-type resistance change memory based on cation transport in oxide thin films |
| Sub Title (in English) |
|
| Keyword(1) |
oxide |
| Keyword(2) |
cation transport |
| Keyword(3) |
redox reaction |
| Keyword(4) |
Moisture absorption |
| Keyword(5) |
conductance quantization |
| Keyword(6) |
synaptic behavior |
| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Tohru Tsuruoka |
| 1st Author's Affiliation |
National Institute for Materials Science (NIMS) |
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| Speaker |
Author-1 |
| Date Time |
2016-07-08 14:55:00 |
| Presentation Time |
50 minutes |
| Registration for |
MRIS |
| Paper # |
MR2016-17 |
| Volume (vol) |
vol.116 |
| Number (no) |
no.125 |
| Page |
pp.25-29 |
| #Pages |
5 |
| Date of Issue |
2016-07-01 (MR) |