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Paper Abstract and Keywords
Presentation 2016-10-28 17:00
Stability of organic physically unclonable function for voltage fractuation.
Kazunori Kuribara, Yohei Hori, Toshihiro Katashita (AIST), Kazuaki Kakita, Yasuhiro Tanaka (Ube Inds.), Manabu Yoshida (AIST) OME2016-47
Abstract (in Japanese) (See Japanese page) 
(in English) We have investigated stability of novel security system. We fabricate organic ring oscillators (ROs) and consider them as core circuit of physically unclonable function (PUF). We generate unique numbers from variance of frequency of ROs and check their stability in various operation voltage as voltage fluctuation. In a result, our RO-PUF shows low error rate of 4.8$times10^{-5}$ at 2 V. And even at 2.2 V, the rate keeps less than 0.1. On the other hand, inter Hamming distance between two chips is calculated as 0.22 to 0.33 which is high enough compared with error rate. Therefore, it is suggested that our RO-PUF works stably with operation voltage of below 2V.
Keyword (in Japanese) (See Japanese page) 
(in English) Organic transistor / Self-assembly / Low voltage / Flexible / Security / Physically unclonable function / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 281, OME2016-47, pp. 39-42, Oct. 2016.
Paper # OME2016-47 
Date of Issue 2016-10-21 (OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OME  
Conference Date 2016-10-28 - 2016-10-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Organic device, Materials, General 
Paper Information
Registration To OME 
Conference Code 2016-10-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Stability of organic physically unclonable function for voltage fractuation. 
Sub Title (in English)  
Keyword(1) Organic transistor  
Keyword(2) Self-assembly  
Keyword(3) Low voltage  
Keyword(4) Flexible  
Keyword(5) Security  
Keyword(6) Physically unclonable function  
Keyword(7)  
Keyword(8)  
1st Author's Name Kazunori Kuribara  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Yohei Hori  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Toshihiro Katashita  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Kazuaki Kakita  
4th Author's Affiliation Ube Industries, Ltd. (Ube Inds.)
5th Author's Name Yasuhiro Tanaka  
5th Author's Affiliation Ube Industries, Ltd. (Ube Inds.)
6th Author's Name Manabu Yoshida  
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2016-10-28 17:00:00 
Presentation Time 20 minutes 
Registration for OME 
Paper # OME2016-47 
Volume (vol) vol.116 
Number (no) no.281 
Page pp.39-42 
#Pages 4 
Date of Issue 2016-10-21 (OME) 

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