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Paper Abstract and Keywords
Presentation 2017-01-31 13:10
Nondestructive OLED diagnostics by using optical EFISHG technique
Dai Taguchi, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Tech) EMD2016-81 MR2016-53 SCE2016-59 EID2016-60 ED2016-124 CPM2016-125 SDM2016-124 ICD2016-112 OME2016-93
Abstract (in Japanese) (See Japanese page) 
(in English) By using electric-field-induced optical second-harmonic generation (EFISHG) measurement, we investigated non-destructive method for the detection of pre-electrical breakdown phenomena. In this paper, EFISHG measurements of double-layer organic light-emitting diodes (indium zinc oxide (IZO)/a-NPD/Alq3/Al) is presented to show remarkable carrier accumulation happens at the a-NPD/Alq3 interface as a pre-electrical breakdown phenomenon.
Keyword (in Japanese) (See Japanese page) 
(in English) electric-field-induced optical second-harmonic generation / non-destructive measurement / organic light-emitting diode / Diagnostic method / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 447, OME2016-93, pp. 59-64, Jan. 2017.
Paper # OME2016-93 
Date of Issue 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2016-81 MR2016-53 SCE2016-59 EID2016-60 ED2016-124 CPM2016-125 SDM2016-124 ICD2016-112 OME2016-93

Conference Information
Committee ICD CPM ED EID EMD MRIS OME SCE 
Conference Date 2017-01-30 - 2017-01-31 
Place (in Japanese) (See Japanese page) 
Place (in English) Miyajima-Morino-Yado(Hiroshima) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Circuit, Device and Engineering Science 
Paper Information
Registration To OME 
Conference Code 2017-01-ICD-CPM-ED-EID-EMD-MR-OME-SCE-SDM-QIT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Nondestructive OLED diagnostics by using optical EFISHG technique 
Sub Title (in English)  
Keyword(1) electric-field-induced optical second-harmonic generation  
Keyword(2) non-destructive measurement  
Keyword(3) organic light-emitting diode  
Keyword(4) Diagnostic method  
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1st Author's Name Dai Taguchi  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
2nd Author's Name Takaaki Manaka  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
3rd Author's Name Mitsumasa Iwamoto  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
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Speaker Author-1 
Date Time 2017-01-31 13:10:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # EMD2016-81, MR2016-53, SCE2016-59, EID2016-60, ED2016-124, CPM2016-125, SDM2016-124, ICD2016-112, OME2016-93 
Volume (vol) vol.116 
Number (no) no.439(EMD), no.440(MR), no.441(SCE), no.442(EID), no.443(ED), no.444(CPM), no.445(SDM), no.446(ICD), no.447(OME) 
Page pp.59-64 
#Pages 6 
Date of Issue 2017-01-23 (EMD, MR, SCE, EID, ED, CPM, SDM, ICD, OME) 

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