Paper Abstract and Keywords |
Presentation |
2017-03-02 15:50
[Invited Lecture]
Accurate Evaluation Technique of Complex Permittivity for Low Permittivity Dielectric Films using a Cavity Resonator Method in 60 GHz band Takashi Shimizu, Shunsuke Kojima, Yoshinori Kogami (Utsunomiya Univ.) MW2016-200 ICD2016-130 Link to ES Tech. Rep. Archives: MW2016-200 ICD2016-130 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In order to realize modern millimeter wave applications, the accurate value of complex permittivity of low permittivity dielec-tric films with excellent characteristics are needed by circuit designers and material developers. However, there are few ac-curate measurement methods for dielectric films in the millimeter wave region. In this paper, an accurate evaluation tech-nique for thin dielectric films using a novel V band cavity in 60 GHz band is proposed on the basis of a cavity resonator method. The novel V band cavity with small excitation holes, which does not affect the resonant electromagnetic fields, is designed and fabricated. The six kinds of thin dielectric film were measured by the proposed technique using the novel cavi-ty. The measured results and the uncertainty analysis validate the accuracy and the usefulness of the proposed method. Moreover, it was verified that this technique can evaluate thin samples with thicknesses of 10 m or more. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Cavity resonator method / Complex permittivity / Low-loss dielectric materials / Millimeter-wave / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 486, MW2016-200, pp. 67-72, March 2017. |
Paper # |
MW2016-200 |
Date of Issue |
2017-02-23 (MW, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
MW2016-200 ICD2016-130 Link to ES Tech. Rep. Archives: MW2016-200 ICD2016-130 |
Conference Information |
Committee |
MW ICD |
Conference Date |
2017-03-02 - 2017-03-03 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Okayama Prefectural Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Microwave Integrated Circuit / Microwave Technologies |
Paper Information |
Registration To |
MW |
Conference Code |
2017-03-MW-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Accurate Evaluation Technique of Complex Permittivity for Low Permittivity Dielectric Films using a Cavity Resonator Method in 60 GHz band |
Sub Title (in English) |
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Keyword(1) |
Cavity resonator method |
Keyword(2) |
Complex permittivity |
Keyword(3) |
Low-loss dielectric materials |
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Millimeter-wave |
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1st Author's Name |
Takashi Shimizu |
1st Author's Affiliation |
Utsunomiya University (Utsunomiya Univ.) |
2nd Author's Name |
Shunsuke Kojima |
2nd Author's Affiliation |
Utsunomiya University (Utsunomiya Univ.) |
3rd Author's Name |
Yoshinori Kogami |
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Utsunomiya University (Utsunomiya Univ.) |
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Speaker |
Author-1 |
Date Time |
2017-03-02 15:50:00 |
Presentation Time |
20 minutes |
Registration for |
MW |
Paper # |
MW2016-200, ICD2016-130 |
Volume (vol) |
vol.116 |
Number (no) |
no.486(MW), no.487(ICD) |
Page |
pp.67-72 |
#Pages |
6 |
Date of Issue |
2017-02-23 (MW, ICD) |
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