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Paper Abstract and Keywords
Presentation 2017-04-20 14:15
[Invited Lecture] TLC NAND Flash Memory Control Techniques to Reduce Errors of Read-Hot and Cold Data for Data Centers
Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2017-6
Abstract (in Japanese) (See Japanese page) 
(in English) In cloud data centers, NAND flash memory stores both read-hot and cold data. This paper describes that the threshold voltage distribution shifts are different between hot and cold data. In particular, threshold voltage distribution of hot data shifts complicatedly. In the conventional SSD, hot and cold data are mixed in the same NAND flash block. Thus, different read voltages cannot be applied. To solve this problem, this paper proposes SSD controller which allocates hot or cold data in hot or cold regions in TLC NAND flash. Then, apply optimal read voltages both hot and cold data. As a result, measured errors decrease by 85% and measured acceptable read cycles increase by 6.7-times.
Keyword (in Japanese) (See Japanese page) 
(in English) NAND flash memory / data center / SSD / reliability / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 9, ICD2017-6, pp. 29-34, April 2017.
Paper # ICD2017-6 
Date of Issue 2017-04-13 (ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2017-6

Conference Information
Committee ICD  
Conference Date 2017-04-20 - 2017-04-21 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2017-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) TLC NAND Flash Memory Control Techniques to Reduce Errors of Read-Hot and Cold Data for Data Centers 
Sub Title (in English)  
Keyword(1) NAND flash memory  
Keyword(2) data center  
Keyword(3) SSD  
Keyword(4) reliability  
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1st Author's Name Toshiki Nakamura  
1st Author's Affiliation Chuo University (Chuo Univ.)
2nd Author's Name Atsuro Kobayashi  
2nd Author's Affiliation Chuo University (Chuo Univ.)
3rd Author's Name Ken Takeuchi  
3rd Author's Affiliation Chuo University (Chuo Univ.)
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Speaker Author-1 
Date Time 2017-04-20 14:15:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2017-6 
Volume (vol) vol.117 
Number (no) no.9 
Page pp.29-34 
#Pages 6 
Date of Issue 2017-04-13 (ICD) 

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