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Paper Abstract and Keywords
Presentation 2017-06-20 13:20
[Invited Lecture] Development of Quantum Imaging Detector using SOI Technology -- Looking Elementary Particles and X-rays with Semiconductor --
Yasuo Arai (KEK) SDM2017-22
Abstract (in Japanese) (See Japanese page) 
(in English) Silicon is a good material for detecting quantum beam (Photon, X-ray, Gamma-ray, Electron, Ion, Neutron etc.) and also good for implementing electronics. Then combining these functions in a single chip is sought but it was difficult to realize in standard bulk CMOS technology.
We have developed monolithic radiation image sensors using Silicon-On-Insulator (SOI) technology. This enables smaller pixel size than existing detector and in-pixel data processing, thus opened new detection method.
Keyword (in Japanese) (See Japanese page) 
(in English) SOI / radiation / imaging / X-ray / quantum beam / CMOS / detector /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 101, SDM2017-22, pp. 5-8, June 2017.
Paper # SDM2017-22 
Date of Issue 2017-06-13 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2017-22

Conference Information
Committee SDM  
Conference Date 2017-06-20 - 2017-06-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Campus Innovation Center Tokyo 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Material Science and Process Technology for MOS Devices and Memories 
Paper Information
Registration To SDM 
Conference Code 2017-06-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of Quantum Imaging Detector using SOI Technology 
Sub Title (in English) Looking Elementary Particles and X-rays with Semiconductor 
Keyword(1) SOI  
Keyword(2) radiation  
Keyword(3) imaging  
Keyword(4) X-ray  
Keyword(5) quantum beam  
Keyword(6) CMOS  
Keyword(7) detector  
Keyword(8)  
1st Author's Name Yasuo Arai  
1st Author's Affiliation High Energy Accelerator Research Organization (KEK)
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Speaker Author-1 
Date Time 2017-06-20 13:20:00 
Presentation Time 20 minutes 
Registration for SDM 
Paper # SDM2017-22 
Volume (vol) vol.117 
Number (no) no.101 
Page pp.5-8 
#Pages 4 
Date of Issue 2017-06-13 (SDM) 

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