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Paper Abstract and Keywords
Presentation 2017-11-10 14:30
[Invited Talk] An Accurate Metric to Control Time Step of Transient Device Simulation by Matrix Exponential Method
Shigetaka Kumashiro, Tatsuya Kamei, Akira Hiroki, Kazutoshi Kobayashi (KIT) SDM2017-70 Link to ES Tech. Rep. Archives: SDM2017-70
Abstract (in Japanese) (See Japanese page) 
(in English) An accurate metric for the time step control in the power device transient simulation is proposed. This metric contains an exponential term of the dominant time constant of the whole device structure obtained by the matrix exponential method. The proposed metric allows larger time step widths than the conventional metric of the 2nd-order approximation of the local truncation error because it focuses on the dominant part of the transient response and its truncation error approximation is more accurate. Total CPU-time of the transient simulation of a silicon power DMOSFET by using the proposed method decreases down to 30% of that by the conventional metric with assuring the current accuracy of the dominant transient response.
Keyword (in Japanese) (See Japanese page) 
(in English) Power device / Transient device simulation / Time step control / Local truncation error / Matrix exponential method / Arnoldi method / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 290, SDM2017-70, pp. 47-52, Nov. 2017.
Paper # SDM2017-70 
Date of Issue 2017-11-02 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2017-70 Link to ES Tech. Rep. Archives: SDM2017-70

Conference Information
Committee SDM  
Conference Date 2017-11-09 - 2017-11-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2017-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Accurate Metric to Control Time Step of Transient Device Simulation by Matrix Exponential Method 
Sub Title (in English)  
Keyword(1) Power device  
Keyword(2) Transient device simulation  
Keyword(3) Time step control  
Keyword(4) Local truncation error  
Keyword(5) Matrix exponential method  
Keyword(6) Arnoldi method  
1st Author's Name Shigetaka Kumashiro  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Tatsuya Kamei  
2nd Author's Affiliation Kyoto Institute of Technology (KIT)
3rd Author's Name Akira Hiroki  
3rd Author's Affiliation Kyoto Institute of Technology (KIT)
4th Author's Name Kazutoshi Kobayashi  
4th Author's Affiliation Kyoto Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2017-11-10 14:30:00 
Presentation Time 60 minutes 
Registration for SDM 
Paper # SDM2017-70 
Volume (vol) vol.117 
Number (no) no.290 
Page pp.47-52 
Date of Issue 2017-11-02 (SDM) 

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