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Paper Abstract and Keywords
Presentation 2017-12-15 14:20
Estimation by non-negative matrix factorization of dislocation regions in photoluminescence image of multicrystalline silicon
Hiroaki Kudo, Yusuke Hayama, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami (Nagoya Univ.) IMQ2017-22
Abstract (in Japanese) (See Japanese page) 
(in English) In this report, we studied a specified method of regions including dislocations which are crystallographic defects in a photoluminescence (PL) image of multicrystalline silicon wafers. We utilized a method of non-negative matrix factorization (NMF) to reconstruct the wafer image. We assumed regions of dislocations caused large represent errors and presented darker colors. We obtained effective results by the proposed method than results of sparse coding methods using bases based on independent component analysis or NMF. Sparse coding methods allow negative values as coefficients matrix. As sample images of the learning process, images without dislocations lead effective results.
Keyword (in Japanese) (See Japanese page) 
(in English) multicrystalline silicon / photoluminescence image / dislocation / non-negative matrix factorization / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 356, IMQ2017-22, pp. 13-18, Dec. 2017.
Paper # IMQ2017-22 
Date of Issue 2017-12-08 (IMQ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee IMQ  
Conference Date 2017-12-15 - 2017-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka University, Hamamatsu Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Picture Display, etc. 
Paper Information
Registration To IMQ 
Conference Code 2017-12-IMQ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimation by non-negative matrix factorization of dislocation regions in photoluminescence image of multicrystalline silicon 
Sub Title (in English)  
Keyword(1) multicrystalline silicon  
Keyword(2) photoluminescence image  
Keyword(3) dislocation  
Keyword(4) non-negative matrix factorization  
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1st Author's Name Hiroaki Kudo  
1st Author's Affiliation Nagoya University (Nagoya Univ.)
2nd Author's Name Yusuke Hayama  
2nd Author's Affiliation Nagoya University (Nagoya Univ.)
3rd Author's Name Tetsuya Matsumoto  
3rd Author's Affiliation Nagoya University (Nagoya Univ.)
4th Author's Name Kentaro Kutsukake  
4th Author's Affiliation Nagoya University (Nagoya Univ.)
5th Author's Name Noritaka Usami  
5th Author's Affiliation Nagoya University (Nagoya Univ.)
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Speaker
Date Time 2017-12-15 14:20:00 
Presentation Time 25 
Registration for IMQ 
Paper # IMQ2017-22 
Volume (vol) 117 
Number (no) no.356 
Page pp.13-18 
#Pages
Date of Issue 2017-12-08 (IMQ) 


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