| Paper Abstract and Keywords |
| Presentation |
2018-02-23 10:35
[Special Invited Talk]
Epitaxial Growth of Ge on Si and Photodetector Applications Yasuhiko Ishikawa (Toyohashi Univ. Tech.) LQE2017-152 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Epitaxial growth of Ge layers on Si and applications to photodetectors (PDs) in the optical communication wavelength range (1.3–1.6 µm) are described. In spite of the critical layer thickness of Ge on Si as small as a few nm due to the large lattice mismatch of 4%, high-quality epitaxial layers of Ge with an atomically flat surface are directly grown on Si, using a low-temperature buffer layer technique and a post-growth annealing process. Characteristics for PDs of Ge layers on Si are presented. Strain-engineered PDs for the detection wavelength control and applications to electro-absorption optical modulators as well as light emitters are also introduced. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Silicon Photonics / Germanium / Epitaxial Growth / Photodetectors / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 117, no. 448, LQE2017-152, pp. 7-10, Feb. 2018. |
| Paper # |
LQE2017-152 |
| Date of Issue |
2018-02-16 (LQE) |
| ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
LQE2017-152 |
| Conference Information |
| Committee |
LQE |
| Conference Date |
2018-02-23 - 2018-02-23 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
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| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
LQE |
| Conference Code |
2018-02-LQE |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Epitaxial Growth of Ge on Si and Photodetector Applications |
| Sub Title (in English) |
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| Keyword(1) |
Silicon Photonics |
| Keyword(2) |
Germanium |
| Keyword(3) |
Epitaxial Growth |
| Keyword(4) |
Photodetectors |
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| 1st Author's Name |
Yasuhiko Ishikawa |
| 1st Author's Affiliation |
Toyohashi University of Technology (Toyohashi Univ. Tech.) |
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| Speaker |
Author-1 |
| Date Time |
2018-02-23 10:35:00 |
| Presentation Time |
60 minutes |
| Registration for |
LQE |
| Paper # |
LQE2017-152 |
| Volume (vol) |
vol.117 |
| Number (no) |
no.448 |
| Page |
pp.7-10 |
| #Pages |
4 |
| Date of Issue |
2018-02-16 (LQE) |