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Paper Abstract and Keywords
Presentation 2018-03-07 15:00
Suggestion of Test Case Generation Method with Priority Based on Use Case of User for System Test
Emi Saito, Ai Toshikuni, Yuichiroh Nakagawa (Hitachi) SS2017-76
Abstract (in Japanese) (See Japanese page) 
(in English) In embedded systems, developers have a demand to find serious defects early. We suppose that it is serious as defects to happen in configuration similar to real situations of user, and propose test case and priority generation method based on real situations of user. This method generates test cases by a combination of conditions and contents that affect operation of the system. In addition, we can judge similarity to real situations of user from information used for test design, and grant priority based on judgement result by the proposed method. We apply packaged air conditioning systems for the case study of the method.
Keyword (in Japanese) (See Japanese page) 
(in English) priority / system test / embedded system / test case generation / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 477, SS2017-76, pp. 69-74, March 2018.
Paper # SS2017-76 
Date of Issue 2018-02-27 (SS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2017-76

Conference Information
Committee SS  
Conference Date 2018-03-06 - 2018-03-07 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To SS 
Conference Code 2018-03-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Suggestion of Test Case Generation Method with Priority Based on Use Case of User for System Test 
Sub Title (in English)  
Keyword(1) priority  
Keyword(2) system test  
Keyword(3) embedded system  
Keyword(4) test case generation  
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1st Author's Name Emi Saito  
1st Author's Affiliation Hitachi (Hitachi)
2nd Author's Name Ai Toshikuni  
2nd Author's Affiliation Hitachi (Hitachi)
3rd Author's Name Yuichiroh Nakagawa  
3rd Author's Affiliation Hitachi (Hitachi)
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Speaker Author-1 
Date Time 2018-03-07 15:00:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2017-76 
Volume (vol) vol.117 
Number (no) no.477 
Page pp.69-74 
#Pages 6 
Date of Issue 2018-02-27 (SS) 

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