Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-04-13 11:35
Optical 3D Nano Artifact-metrics using White Light Interferometry
Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3
Abstract (in Japanese) (See Japanese page) 
(in English) We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an interference fringe image captured by a white light interferometer.
Keyword (in Japanese) (See Japanese page) 
(in English) Nano-artifact metrics / White light interferometer / Interference image / Security / Identity Management / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 3, HWS2018-3, pp. 11-16, April 2018.
Paper # HWS2018-3 
Date of Issue 2018-04-06 (HWS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2018-3

Conference Information
Committee HWS  
Conference Date 2018-04-13 - 2018-04-13 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To HWS 
Conference Code 2018-04-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical 3D Nano Artifact-metrics using White Light Interferometry 
Sub Title (in English)  
Keyword(1) Nano-artifact metrics  
Keyword(2) White light interferometer  
Keyword(3) Interference image  
Keyword(4) Security  
Keyword(5) Identity Management  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Naoki Yoshida  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Yosuke Ueba  
2nd Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
3rd Author's Name Shumpei Nishio  
3rd Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
4th Author's Name Yasuyuki Ohyagi  
4th Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
5th Author's Name Morihisa Hoga  
5th Author's Affiliation Compass21 (Compass21)
6th Author's Name Naoya Tate  
6th Author's Affiliation Kyushu University (KU)
7th Author's Name Makoto Naruse  
7th Author's Affiliation National Institute of Information and Communications Technology (NICT)
8th Author's Name Tsutomu Matsumoto  
8th Author's Affiliation Yokohama National University (YNU)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2018-04-13 11:35:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2018-3 
Volume (vol) vol.118 
Number (no) no.3 
Page pp.11-16 
#Pages 6 
Date of Issue 2018-04-06 (HWS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan