Paper Abstract and Keywords |
Presentation |
2018-04-13 11:35
Optical 3D Nano Artifact-metrics using White Light Interferometry Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an interference fringe image captured by a white light interferometer. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Nano-artifact metrics / White light interferometer / Interference image / Security / Identity Management / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 3, HWS2018-3, pp. 11-16, April 2018. |
Paper # |
HWS2018-3 |
Date of Issue |
2018-04-06 (HWS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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HWS2018-3 |
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