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Paper Abstract and Keywords
Presentation 2018-07-25 14:25
Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection
Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19
Abstract (in Japanese) (See Japanese page) 
(in English) Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported. When evaluating whether a device is a target of such a threat, traditionally, a method of directly tracing an attack meth-od has been used. For that reason, evaluation takes about the same time as the attack. In this paper, we propose a method to shorten the evaluation time using Gaussian noise. To evaluate whether the device is the subject of the threat de-scribed above, it is necessary to investigate whether there are frequencies causing a setup time violation in the crypto-graphic module from the outside the device. To find effective frequencies causing faults, conventionally, a wide fre-quency range was searched for sufficient time while changing the frequency step. On the other hand, in this paper, we inject Gaussian noise with broadband frequency components to the target equipment to eliminate frequency search and evaluate whether it is a threat target in a short time.
Keyword (in Japanese) (See Japanese page) 
(in English) Intentional Electromagnetic Interference / Fault Injection Attack / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 153, HWS2018-17, pp. 77-81, July 2018.
Paper # HWS2018-17 
Date of Issue 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19

Conference Information
Committee HWS ISEC SITE ICSS EMM IPSJ-CSEC IPSJ-SPT  
Conference Date 2018-07-25 - 2018-07-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Sapporo Convention Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2018-07-HWS-ISEC-SITE-ICSS-EMM-CSEC-SPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection 
Sub Title (in English)  
Keyword(1) Intentional Electromagnetic Interference  
Keyword(2) Fault Injection Attack  
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1st Author's Name Takumi Okamoto  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Yuichi Hayashi  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Naofumi Homma  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Arthur Beckers  
5th Author's Affiliation imec-COSIC KU Leuven (KU Leuven)
6th Author's Name Josep Balasch  
6th Author's Affiliation imec-COSIC KU Leuven (KU Leuven)
7th Author's Name Benedikt Gierlichs  
7th Author's Affiliation imec-COSIC KU Leuven (KU Leuven)
8th Author's Name Ingrid Verbauwhede  
8th Author's Affiliation imec-COSIC KU Leuven (KU Leuven)
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Speaker Author-1 
Date Time 2018-07-25 14:25:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # ISEC2018-20, SITE2018-12, HWS2018-17, ICSS2018-23, EMM2018-19 
Volume (vol) vol.118 
Number (no) no.151(ISEC), no.152(SITE), no.153(HWS), no.154(ICSS), no.155(EMM) 
Page pp.77-81 
#Pages
Date of Issue 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) 


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