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Paper Abstract and Keywords
Presentation 2018-08-09 14:35
[Invited Talk] Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic
Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Ayuka Morioka, Bai Xu, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Hiromitsu Hada, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada (NEC) SDM2018-51 ICD2018-38
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
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Reference Info. IEICE Tech. Rep., vol. 118, no. 172, SDM2018-51, pp. 131-135, Aug. 2018.
Paper # SDM2018-51 
Date of Issue 2018-07-31 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2018-51 ICD2018-38

Conference Information
Committee SDM ICD ITE-IST  
Conference Date 2018-08-07 - 2018-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Graduate School of IST M Bldg., M151 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To SDM 
Conference Code 2018-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic 
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1st Author's Name Ryusuke Nebashi  
1st Author's Affiliation NEC Corporation (NEC)
2nd Author's Name Naoki Banno  
2nd Author's Affiliation NEC Corporation (NEC)
3rd Author's Name Makoto Miyamura  
3rd Author's Affiliation NEC Corporation (NEC)
4th Author's Name Ayuka Morioka  
4th Author's Affiliation NEC Corporation (NEC)
5th Author's Name Bai Xu  
5th Author's Affiliation NEC Corporation (NEC)
6th Author's Name Koichiro Okamoto  
6th Author's Affiliation NEC Corporation (NEC)
7th Author's Name Noriyuki Iguchi  
7th Author's Affiliation NEC Corporation (NEC)
8th Author's Name Hideaki Numata  
8th Author's Affiliation NEC Corporation (NEC)
9th Author's Name Hiromitsu Hada  
9th Author's Affiliation NEC Corporation (NEC)
10th Author's Name Tadahiko Sugibayashi  
10th Author's Affiliation NEC Corporation (NEC)
11th Author's Name Toshitsugu Sakamoto  
11th Author's Affiliation NEC Corporation (NEC)
12th Author's Name Munehiro Tada  
12th Author's Affiliation NEC Corporation (NEC)
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Speaker Author-1 
Date Time 2018-08-09 14:35:00 
Presentation Time 45 minutes 
Registration for SDM 
Paper # SDM2018-51, ICD2018-38 
Volume (vol) vol.118 
Number (no) no.172(SDM), no.173(ICD) 
Page pp.131-135 
#Pages 5 
Date of Issue 2018-07-31 (SDM, ICD) 

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