Paper Abstract and Keywords |
Presentation |
2019-01-22 11:15
Logical Failure Detection in Question-and-Answer Sessions Towards A Practical Mock Interview System Kohei Shimizu, Komei Arasawa, Ryohei Watanabe, Shun Hattori (Muroran Inst. of Tech.) IN2018-83 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In job hunting, oral interviews are important examinations for job hunters to appeal to their targeted companies and for companies to acquire human resources who they want to seek. In oral interviews, interviewers of companies scrutinize each job hunter from various viewpoints. Among them, "logical thinking" is one of especially-important factors. In recent years, the questions to find out whether or not each job hunter can answer them with logical thinking are often asked in oral interviews. However, it is difficult for a job hunter to judge whether or not s/he was evaluated to be able to answer logically by her/his targeted companies, because there is no oppotunity for her/him to receive feedback about it in actual interviews. Meanwhile, it is difficult for a job hunter to improve her/his answers using the existing mock interview systems, because they cannot detect a logical failure in her/his answers. Therefore, this paper proposes a more practical mock interview system that aims at helping job hunters to improve their answers by themselves, and that automatically detects logical failures in a job hunter's answer to a company's question by estimating the relationship between sentences focusing on the important words and the part of speech (in particular, conjunction and adverbial particle) of words in her/his answer. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Mock Interview / Question and Answering / Machine Learning / Word2Vec / TF-IDF / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 408, IN2018-83, pp. 63-68, Jan. 2019. |
Paper # |
IN2018-83 |
Date of Issue |
2019-01-14 (IN) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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IN2018-83 |
Conference Information |
Committee |
IN |
Conference Date |
2019-01-21 - 2019-01-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
WINC AICHI |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Contents Distribution, Social Networking Services, Data Analytics and Processing Platform, Big data, etc. |
Paper Information |
Registration To |
IN |
Conference Code |
2019-01-IN |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Logical Failure Detection in Question-and-Answer Sessions Towards A Practical Mock Interview System |
Sub Title (in English) |
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Keyword(1) |
Mock Interview |
Keyword(2) |
Question and Answering |
Keyword(3) |
Machine Learning |
Keyword(4) |
Word2Vec |
Keyword(5) |
TF-IDF |
Keyword(6) |
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Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Kohei Shimizu |
1st Author's Affiliation |
Muroran Institute of Technology (Muroran Inst. of Tech.) |
2nd Author's Name |
Komei Arasawa |
2nd Author's Affiliation |
Muroran Institute of Technology (Muroran Inst. of Tech.) |
3rd Author's Name |
Ryohei Watanabe |
3rd Author's Affiliation |
Muroran Institute of Technology (Muroran Inst. of Tech.) |
4th Author's Name |
Shun Hattori |
4th Author's Affiliation |
Muroran Institute of Technology (Muroran Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2019-01-22 11:15:00 |
Presentation Time |
25 minutes |
Registration for |
IN |
Paper # |
IN2018-83 |
Volume (vol) |
vol.118 |
Number (no) |
no.408 |
Page |
pp.63-68 |
#Pages |
6 |
Date of Issue |
2019-01-14 (IN) |
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