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Paper Abstract and Keywords
Presentation 2019-01-22 11:15
Logical Failure Detection in Question-and-Answer Sessions Towards A Practical Mock Interview System
Kohei Shimizu, Komei Arasawa, Ryohei Watanabe, Shun Hattori (Muroran Inst. of Tech.) IN2018-83
Abstract (in Japanese) (See Japanese page) 
(in English) In job hunting, oral interviews are important examinations for job hunters to appeal to their targeted companies and for companies to acquire human resources who they want to seek. In oral interviews, interviewers of companies scrutinize each job hunter from various viewpoints. Among them, "logical thinking" is one of especially-important factors. In recent years, the questions to find out whether or not each job hunter can answer them with logical thinking are often asked in oral interviews. However, it is difficult for a job hunter to judge whether or not s/he was evaluated to be able to answer logically by her/his targeted companies, because there is no oppotunity for her/him to receive feedback about it in actual interviews. Meanwhile, it is difficult for a job hunter to improve her/his answers using the existing mock interview systems, because they cannot detect a logical failure in her/his answers. Therefore, this paper proposes a more practical mock interview system that aims at helping job hunters to improve their answers by themselves, and that automatically detects logical failures in a job hunter's answer to a company's question by estimating the relationship between sentences focusing on the important words and the part of speech (in particular, conjunction and adverbial particle) of words in her/his answer.
Keyword (in Japanese) (See Japanese page) 
(in English) Mock Interview / Question and Answering / Machine Learning / Word2Vec / TF-IDF / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 408, IN2018-83, pp. 63-68, Jan. 2019.
Paper # IN2018-83 
Date of Issue 2019-01-14 (IN) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee IN  
Conference Date 2019-01-21 - 2019-01-22 
Place (in Japanese) (See Japanese page) 
Place (in English) WINC AICHI 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Contents Distribution, Social Networking Services, Data Analytics and Processing Platform, Big data, etc. 
Paper Information
Registration To IN 
Conference Code 2019-01-IN 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Logical Failure Detection in Question-and-Answer Sessions Towards A Practical Mock Interview System 
Sub Title (in English)  
Keyword(1) Mock Interview  
Keyword(2) Question and Answering  
Keyword(3) Machine Learning  
Keyword(4) Word2Vec  
Keyword(5) TF-IDF  
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Keyword(7)  
Keyword(8)  
1st Author's Name Kohei Shimizu  
1st Author's Affiliation Muroran Institute of Technology (Muroran Inst. of Tech.)
2nd Author's Name Komei Arasawa  
2nd Author's Affiliation Muroran Institute of Technology (Muroran Inst. of Tech.)
3rd Author's Name Ryohei Watanabe  
3rd Author's Affiliation Muroran Institute of Technology (Muroran Inst. of Tech.)
4th Author's Name Shun Hattori  
4th Author's Affiliation Muroran Institute of Technology (Muroran Inst. of Tech.)
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Speaker
Date Time 2019-01-22 11:15:00 
Presentation Time 25 
Registration for IN 
Paper # IN2018-83 
Volume (vol) 118 
Number (no) no.408 
Page pp.63-68 
#Pages
Date of Issue 2019-01-14 (IN) 


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