Paper Abstract and Keywords |
Presentation |
2020-02-26 12:00
A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2019-90 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
With the complexity for VLSIs, transition fault testing is required. However, VLSIs generally have more untestable transition faults than untestable stuck at faults due to the circuit structures. From the view point of structural testing, transition fault coverage might be insufficient and potential timing defects might be escaped. Therefore, design-for-testability to improve transition fault coverage is important. In this paper, we propose LOC test generation models to test control signal lines of multiplexers with n-inputs. The assignments of control signals for the LOC test generation models are realized by controller augmentation. Our experimental results for high-level benchmark circuits show that the proposed method achieved 100% fault coverage for transition faults in the data-paths. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
controller augmentation / test sensitization states / multiplexers / launch on capture / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 420, DC2019-90, pp. 25-30, Feb. 2020. |
Paper # |
DC2019-90 |
Date of Issue |
2020-02-19 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2019-90 |
Conference Information |
Committee |
DC |
Conference Date |
2020-02-26 - 2020-02-26 |
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(See Japanese page) |
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Paper Information |
Registration To |
DC |
Conference Code |
2020-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs |
Sub Title (in English) |
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Keyword(1) |
controller augmentation |
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test sensitization states |
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multiplexers |
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launch on capture |
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1st Author's Name |
Yuki Takeuchi |
1st Author's Affiliation |
Nihon University (Nihon Univ.) |
2nd Author's Name |
Toshinori Hosokawa |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Hiroshi Yamazaki |
3rd Author's Affiliation |
Nihon University (Nihon Univ.) |
4th Author's Name |
Masayoshi Yoshimura |
4th Author's Affiliation |
Kyoto Sangyo University (Kyoto Sangyo Univ.) |
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Speaker |
Author-1 |
Date Time |
2020-02-26 12:00:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2019-90 |
Volume (vol) |
vol.119 |
Number (no) |
no.420 |
Page |
pp.25-30 |
#Pages |
6 |
Date of Issue |
2020-02-19 (DC) |
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