Paper Abstract and Keywords |
Presentation |
2020-11-17 11:20
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 Link to ES Tech. Rep. Archives: ICD2020-35 |
Abstract |
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(See Japanese page) |
(in English) |
(Not available yet) |
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Reference Info. |
IEICE Tech. Rep., vol. 120, no. 236, DC2020-35, pp. 24-29, Nov. 2020. |
Paper # |
DC2020-35 |
Date of Issue |
2020-11-10 (VLD, ICD, DC, RECONF) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 Link to ES Tech. Rep. Archives: ICD2020-35 |
Conference Information |
Committee |
VLD DC RECONF ICD IPSJ-SLDM |
Conference Date |
2020-11-17 - 2020-11-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2020 -New Field of VLSI Design- |
Paper Information |
Registration To |
DC |
Conference Code |
2020-11-VLD-DC-RECONF-ICD-SLDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test |
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1st Author's Name |
Hikaru Tamaki |
1st Author's Affiliation |
Ehime University (Ehime Univ.) |
2nd Author's Name |
Senling Wang |
2nd Author's Affiliation |
Ehime University (Ehime Univ.) |
3rd Author's Name |
Yoshinobu Higami |
3rd Author's Affiliation |
Ehime University (Ehime Univ.) |
4th Author's Name |
Hiroshi Takahashi |
4th Author's Affiliation |
Ehime University (Ehime Univ.) |
5th Author's Name |
Hiroyuki Iwata |
5th Author's Affiliation |
Renesas Electronics Corporation (Renesas) |
6th Author's Name |
Yoichi Maeda |
6th Author's Affiliation |
Renesas Electronics Corporation (Renesas) |
7th Author's Name |
Jun Matsushima |
7th Author's Affiliation |
Renesas Electronics Corporation (Renesas) |
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Speaker |
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Date Time |
2020-11-17 11:20:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
VLD2020-15, ICD2020-35, DC2020-35, RECONF2020-34 |
Volume (vol) |
vol.120 |
Number (no) |
no.234(VLD), no.235(ICD), no.236(DC), no.237(RECONF) |
Page |
pp.24-29 |
#Pages |
6 |
Date of Issue |
2020-11-10 (VLD, ICD, DC, RECONF) |
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