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Paper Abstract and Keywords
Presentation 2020-11-17 10:55
DET Flip-Flops with SEU Detection Capability Using DICE and C-Element
Xu Haijia, Kazuteru Namba (Chiba Univ.) VLD2020-14 ICD2020-34 DC2020-34 RECONF2020-33
Abstract (in Japanese) (See Japanese page) 
(in English) Abstract A dual-edge-triggered flip-flop (DET-FF) composed of DICE latch (Dual Interlocked Storage Cell) and C-element for SEU detection has been proposed in this article. The DICE latch has the ability to tolerate SNUs. This design can tolerate most of the SNU that may occur in DET-FF. In addition, this article also presents a circuit design that can detect soft-errors having not been detected by DET-FF. The proposed DET-FF reduces power consumption, while the DICE unit can always guarantee the characteristics of two stable nodes, so that the proposed circuit design can tolerate and detect soft-errors which occur in the circuit while reducing power consumption. The design has been simulated with CMOS circuit, and the results show that the DET-FF is tolerant to soft-errors and can detect SEU (Single Event Upset) events which affect the output results
Keyword (in Japanese) (See Japanese page) 
(in English) Soft error / DICE / Dual-edge-triggered-FF / Radiation tolerant latch / Low power / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 236, DC2020-34, pp. 18-23, Nov. 2020.
Paper # DC2020-34 
Date of Issue 2020-11-10 (VLD, ICD, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2020-14 ICD2020-34 DC2020-34 RECONF2020-33

Conference Information
Committee VLD DC RECONF ICD IPSJ-SLDM  
Conference Date 2020-11-17 - 2020-11-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2020 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2020-11-VLD-DC-RECONF-ICD-SLDM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) DET Flip-Flops with SEU Detection Capability Using DICE and C-Element 
Sub Title (in English)  
Keyword(1) Soft error  
Keyword(2) DICE  
Keyword(3) Dual-edge-triggered-FF  
Keyword(4) Radiation tolerant latch  
Keyword(5) Low power  
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Keyword(8)  
1st Author's Name Xu Haijia  
1st Author's Affiliation Chiba University (Chiba Univ.)
2nd Author's Name Kazuteru Namba  
2nd Author's Affiliation Chiba University (Chiba Univ.)
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Speaker Author-1 
Date Time 2020-11-17 10:55:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2020-14, ICD2020-34, DC2020-34, RECONF2020-33 
Volume (vol) vol.120 
Number (no) no.234(VLD), no.235(ICD), no.236(DC), no.237(RECONF) 
Page pp.18-23 
#Pages 6 
Date of Issue 2020-11-10 (VLD, ICD, DC, RECONF) 

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