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Paper Abstract and Keywords
Presentation 2020-12-11 14:50
Long-term Software Fault Prediction with Wavelet Shrinkage Estimation
Jingchi Wu Hu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2020-32
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, wavelet shrinkage estimation received considerable attentions to estimate stochastic processes such as a non-homogeneous Poisson process in a non-parametric way. In this paper we focus on the long-term prediction of the number of software faults detected in the testing phase, and propose a novel long-term prediction approach based on the wavelet shrinkage estimation. The fundamental idea is to apply the denoizing available fault count data and prediction values, and to minimize a loss function with them. In numerical experiments with actual software fault count data, we investigate the predictive performance of our long-term prediction approach, and compare with the model (software reliability growth model)-based prediction approach with the maximum likelihood estimation.
Keyword (in Japanese) (See Japanese page) 
(in English) Software reliability / fault prediction / non-homogeneous Poisson processes / wavelet / shrinkage estimation / predictive performance / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 286, R2020-32, pp. 12-17, Dec. 2020.
Paper # R2020-32 
Date of Issue 2020-12-04 (R) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2020-32

Conference Information
Committee R  
Conference Date 2020-12-11 - 2020-12-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability International Standard, Maintainability, Reliability General 
Paper Information
Registration To R 
Conference Code 2020-12-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Long-term Software Fault Prediction with Wavelet Shrinkage Estimation 
Sub Title (in English)  
Keyword(1) Software reliability  
Keyword(2) fault prediction  
Keyword(3) non-homogeneous Poisson processes  
Keyword(4) wavelet  
Keyword(5) shrinkage estimation  
Keyword(6) predictive performance  
Keyword(7)  
Keyword(8)  
1st Author's Name Jingchi Wu Hu  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Tadashi Dohi  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Hiroyuki Okamura  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2020-12-11 14:50:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2020-32 
Volume (vol) vol.120 
Number (no) no.286 
Page pp.12-17 
#Pages 6 
Date of Issue 2020-12-04 (R) 

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