Paper Abstract and Keywords |
Presentation |
2021-02-05 11:35
A Novel High Performance Scan-Test-Aware Hardened Latch Design Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have been proposed for reliable LSI designs. Production defects in such hardened latches are difficult to detect with conventional scan testing. In our previous work, we proposed a scan-test-aware hardened latch (STAHL) design which can tolerate soft-errors and has high defect coverage. However, STAHL has higher power and delay overhead than other hardened latches in the literature. In this paper, we propose a novel high performance and scan-test-aware hardened latch (HP-STAHL). Simulation results show that HP-STAHL provides for the first time the same benefits as STAHL in terms of soft-error tolerance and testability. HP-STAHL has lower delay and power delay product (PDP) than a standard latch, which shows that HP-STAHL has high performance. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
soft-error / scan test / hardened latch / defect / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 358, DC2020-71, pp. 12-17, Feb. 2021. |
Paper # |
DC2020-71 |
Date of Issue |
2021-01-29 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2020-71 |
Conference Information |
Committee |
DC |
Conference Date |
2021-02-05 - 2021-02-05 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
DC |
Conference Code |
2021-02-DC |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Novel High Performance Scan-Test-Aware Hardened Latch Design |
Sub Title (in English) |
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soft-error |
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scan test |
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hardened latch |
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defect |
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1st Author's Name |
Ruijun Ma |
1st Author's Affiliation |
Kyushu Institute of Technology (KIT) |
2nd Author's Name |
Stefan Holst |
2nd Author's Affiliation |
Kyushu Institute of Technology (KIT) |
3rd Author's Name |
Xiaoqing Wen |
3rd Author's Affiliation |
Kyushu Institute of Technology (KIT) |
4th Author's Name |
Aibin Yan |
4th Author's Affiliation |
Anhui University (AHU) |
5th Author's Name |
Hui Xu |
5th Author's Affiliation |
Anhui University of Science & Technology (AUST) |
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Speaker |
Author-1 |
Date Time |
2021-02-05 11:35:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2020-71 |
Volume (vol) |
vol.120 |
Number (no) |
no.358 |
Page |
pp.12-17 |
#Pages |
6 |
Date of Issue |
2021-01-29 (DC) |
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