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Paper Abstract and Keywords
Presentation 2021-03-26 11:20
A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level
Kohei Tsuchibuchi, Toshinori Hosokawa (Nihon Univ), Koji Yamazaki (Meiji Univ.) CPSY2020-62 DC2020-92
Abstract (in Japanese) (See Japanese page) 
(in English) With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs. Fault diagnosis, which narrows down suspected faults in advance, is an important step in fault analysis and is important to reduce the cost of fault analysis. To reduce the number of suspected faults, design-for-diagnosability methods such as test point insertion at gate level and layout level have been proposed. However, the design-for-diagnosability methods cause problems such as area overhead and destroy of timing optimization. In this paper, we propose a design-for-diagnosability method at register transfer level. Don't care filling problem of control signals on each state transition of controllers for fault diagnosability is formulated as a pseudo-Boolean optimization problem.
Keyword (in Japanese) (See Japanese page) 
(in English) fault diagnosis / don’t-care filling / register transfer level / pseudo Boolean optimization / design-for-diagnosability / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 436, DC2020-92, pp. 73-78, March 2021.
Paper # DC2020-92 
Date of Issue 2021-03-18 (CPSY, DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2020-62 DC2020-92

Conference Information
Committee CPSY DC IPSJ-SLDM IPSJ-EMB IPSJ-ARC  
Conference Date 2021-03-25 - 2021-03-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) ETNET2021 
Paper Information
Registration To DC 
Conference Code 2021-03-CPSY-DC-SLDM-EMB-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level 
Sub Title (in English)  
Keyword(1) fault diagnosis  
Keyword(2) don’t-care filling  
Keyword(3) register transfer level  
Keyword(4) pseudo Boolean optimization  
Keyword(5) design-for-diagnosability  
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1st Author's Name Kohei Tsuchibuchi  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Koji Yamazaki  
3rd Author's Affiliation Meiji University (Meiji Univ.)
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Speaker Author-1 
Date Time 2021-03-26 11:20:00 
Presentation Time 20 minutes 
Registration for DC 
Paper # CPSY2020-62, DC2020-92 
Volume (vol) vol.120 
Number (no) no.435(CPSY), no.436(DC) 
Page pp.73-78 
#Pages 6 
Date of Issue 2021-03-18 (CPSY, DC) 

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