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Paper Abstract and Keywords
Presentation 2021-11-30 14:50
Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.) R2021-38
Abstract (in Japanese) (See Japanese page) 
(in English) IEC 61508 is widely known as the international standard for the functional safety of electrical/electronic/programmable electronic (E/E/PE) safety-related systems. Especially for the hardware of E/E/PE safety-related systems, IEC 61508 requires to assess their safety based on the safety integrity level (SIL) measured by the target failure measures. However, IEC 61508 does not give us the methodologies on quantitative safety assessment for the E/E/PE safety-related system software because the software failure is treated as a systematic failure. We discuss approximated methods for estimating target failure measures, which are basic measures for allocating SIL, for SIL-based software safety assessment by applying the technical notions of software fault detection count model in software reliability assessment technologies.
Keyword (in Japanese) (See Japanese page) 
(in English) Functional safety / E/E/PE safety-related systems / IEC 61508 / safety integrity level / software reliability model / fault detection model / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 276, R2021-38, pp. 24-29, Nov. 2021.
Paper # R2021-38 
Date of Issue 2021-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2021-38

Conference Information
Committee R  
Conference Date 2021-11-30 - 2021-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability ge 
Paper Information
Registration To R 
Conference Code 2021-11-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model 
Sub Title (in English)  
Keyword(1) Functional safety  
Keyword(2) E/E/PE safety-related systems  
Keyword(3) IEC 61508  
Keyword(4) safety integrity level  
Keyword(5) software reliability model  
Keyword(6) fault detection model  
1st Author's Name Shinji Inoue  
1st Author's Affiliation Kansai University (Kansai Univ.)
2nd Author's Name Takaji Fujiwara  
2nd Author's Affiliation SRATECH Lab. Inc. (SRATECH Lab.)
3rd Author's Name Shigeru Yamada  
3rd Author's Affiliation Tottori University (Tottori Univ.)
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Speaker Author-1 
Date Time 2021-11-30 14:50:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2021-38 
Volume (vol) vol.121 
Number (no) no.276 
Page pp.24-29 
Date of Issue 2021-11-23 (R) 

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