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Paper Abstract and Keywords
Presentation 2021-12-02 15:10
An Improved Method of Layout Pattern Classification with Creating Representative Clip
Tomoya Masutani, Ishino Shuhei, Kunihiro Fujiyoshi (TUAT) VLD2021-44 ICD2021-54 DC2021-50 RECONF2021-52 Link to ES Tech. Rep. Archives: ICD2021-54
Abstract (in Japanese) (See Japanese page) 
(in English) Layout of VLSI is designed according to design rules, however, hotspots may remain due to feature size shrinking. Recently, we proposed a method of grouping layout clips of hotspots according to the similarity to create library, which will be used to detect hotspots from new layout. The grouping of layout clips is called Layout Pattern Classification. In this paper, we propose a method of Layout Pattern Classification considering representative clip creation in order to decrease the number of groups. Experimental results indicate the effectiveness of the proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) Layout Pattern Classification / Clustering / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 277, VLD2021-44, pp. 156-161, Dec. 2021.
Paper # VLD2021-44 
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2021-44 ICD2021-54 DC2021-50 RECONF2021-52 Link to ES Tech. Rep. Archives: ICD2021-54

Conference Information
Committee VLD DC RECONF ICD IPSJ-SLDM  
Conference Date 2021-12-01 - 2021-12-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2021 -New Field of VLSI Design- 
Paper Information
Registration To VLD 
Conference Code 2021-12-VLD-DC-RECONF-ICD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Improved Method of Layout Pattern Classification with Creating Representative Clip 
Sub Title (in English)
Keyword(1) Layout Pattern Classification  
Keyword(2) Clustering  
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1st Author's Name Tomoya Masutani  
1st Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
2nd Author's Name Ishino Shuhei  
2nd Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
3rd Author's Name Kunihiro Fujiyoshi  
3rd Author's Affiliation Tokyo University of Agriculture and Technology (TUAT)
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Speaker Author-1 
Date Time 2021-12-02 15:10:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2021-44, ICD2021-54, DC2021-50, RECONF2021-52 
Volume (vol) vol.121 
Number (no) no.277(VLD), no.278(ICD), no.279(DC), no.280(RECONF) 
Page pp.156-161 
#Pages
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 


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