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| Presentation | 2022-03-04 16:55 Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam Ryutaro Oba, Atsuhiro Nishikata (Tokyo Tech), Masataka Midori, Hiroshi Kurihara (TDK)  EMCJ2021-77 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In the case of an anisotropic dielectric material such as a printed circuit board, the dielectric constant changes with the direction of the transmission line, so it is necessary to understand the dielectric constant as a tensor in the circuit board design where the phase difference of the signal is an issue. In this report, we studied the adjustment method of the axis alignment and focus adjustment of the measurement system in the parallel millimeter-wave beam method using dielectric lens. We confirmed that the parallel beam part is close to the perpendicularly incident plane wave. Furthermore, we measured the transmission $S_{21}$ parameter, which changes when sheet materials is rotated around the beam axis, and thereby estimated the main value of the complex permittivity tensor. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Parallel beam method / Dielectric permittivity anisotropy / Dielectric lens / Axis alignment / Focus adjustment / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 403, EMCJ2021-77, pp. 21-26, March 2022. | |
| Paper # | EMCJ2021-77 | |
| Date of Issue | 2022-02-25 (EMCJ) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2021-77 |
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| Conference Information | |
| Committee | MICT EMCJ |
| Conference Date | 2022-03-04 - 2022-03-04 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Healthcare and Medical Information Communication Technologies, EMC, etc |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2022-03-MICT-EMCJ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Axial Alignment and Focus Adjustment of Lens System and Dielectric Anisotropy Measurement Method for Sheet Materials Using Parallel Millimeter-wave Beam |
| Sub Title (in English) | |
| Keyword(1) | Parallel beam method |
| Keyword(2) | Dielectric permittivity anisotropy |
| Keyword(3) | Dielectric lens |
| Keyword(4) | Axis alignment |
| Keyword(5) | Focus adjustment |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Ryutaro Oba |
| 1st Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 2nd Author's Name | Atsuhiro Nishikata |
| 2nd Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
| 3rd Author's Name | Masataka Midori |
| 3rd Author's Affiliation | TDK Corporation (TDK) |
| 4th Author's Name | Hiroshi Kurihara |
| 4th Author's Affiliation | TDK Corporation (TDK) |
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| Speaker | Author-1 |
| Date Time | 2022-03-04 16:55:00 |
| Presentation Time | 20 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2021-77 |
| Volume (vol) | vol.121 |
| Number (no) | no.403 |
| Page | pp.21-26 |
| #Pages | 6 |
| Date of Issue | 2022-02-25 (EMCJ) |
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