| Paper Abstract and Keywords |
| Presentation |
2022-05-27 16:15
Wet etching of GaN utilizing a photo-electrochemical reaction for functional materials Taketomo Sato, Masachika Toguchi (Hokkaido Univ.) ED2022-13 CPM2022-7 SDM2022-20 |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
A gallium nitride (GaN) porous structure was formed by wet etching utilizing electrochemical reactions. The refractive index of the GaN porous layer can be controlled by the porosity or aperture ratio, and its optical reflectance decreases depending on that. The incident-photon-to-current conversion efficiency (IPCE) of the interface between the GaN porous structure and the electrolyte increased by about 40% compared to that obtained on the unprocessed sample, and the basic absorption edge of the GaN porous structure was shifted in the long-wavelength direction. These characteristics of the GaN porous structure that has the high crystal quality are useful as a functional material. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Gallium Nitride / Electrochemical Etching / Porous Structure / / / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 122, no. 52, ED2022-13, pp. 25-28, May 2022. |
| Paper # |
ED2022-13 |
| Date of Issue |
2022-05-20 (ED, CPM, SDM) |
| ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| Download PDF |
ED2022-13 CPM2022-7 SDM2022-20 |
| Conference Information |
| Committee |
SDM ED CPM |
| Conference Date |
2022-05-27 - 2022-05-27 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Online |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Functional Device Materials, Fabrication, Characterization, and Related Technology |
| Paper Information |
| Registration To |
ED |
| Conference Code |
2022-05-SDM-ED-CPM |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Wet etching of GaN utilizing a photo-electrochemical reaction for functional materials |
| Sub Title (in English) |
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| Keyword(1) |
Gallium Nitride |
| Keyword(2) |
Electrochemical Etching |
| Keyword(3) |
Porous Structure |
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| 1st Author's Name |
Taketomo Sato |
| 1st Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 2nd Author's Name |
Masachika Toguchi |
| 2nd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2022-05-27 16:15:00 |
| Presentation Time |
25 minutes |
| Registration for |
ED |
| Paper # |
ED2022-13, CPM2022-7, SDM2022-20 |
| Volume (vol) |
vol.122 |
| Number (no) |
no.52(ED), no.53(CPM), no.54(SDM) |
| Page |
pp.25-28 |
| #Pages |
4 |
| Date of Issue |
2022-05-20 (ED, CPM, SDM) |