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| Paper Abstract and Keywords | ||
| Presentation | 2022-10-12 14:00 A Don't Care Filling Algorithm of Control Signals for Concurrent Testing Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.)  CPSY2022-24 DC2022-24 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. Test compaction methods have been proposed to reduce the number of test patterns. Therefore, it is important to apply design-for-testability considering concurrent testing. A method such that a logic value assignment problem of don't cares (X) for controllers at register transfer level was formulated as pseudo-Boolean optimization problem to optimize concurrent testing for hardware elements in data-paths was proposed. The method showed that the number of test patterns was reduced for small high-level synthesis benchmark circuits. However, as the number of Xs in the control signal increases, it is difficult to obtain a solution in reasonable time. In this paper, we focus on concurrent testing of operational units whose number of required test patterns is dominant, and propose a heuristic algorithm that can perform concurrent testing of as many operational units as possible and reduce the number of state transitions used for testing as much as possible. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | control signals / don't care filling / concurrent testing / data-paths / heuristic algorithm / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 122, no. 205, DC2022-24, pp. 37-42, Oct. 2022. | |
| Paper # | DC2022-24 | |
| Date of Issue | 2022-10-04 (CPSY, DC) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CPSY2022-24 DC2022-24 |
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| Conference Information | |
| Committee | CPSY DC IPSJ-ARC |
| Conference Date | 2022-10-11 - 2022-10-12 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Yuzawa Toei Hotel |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | System Architecture, Computer Systems, Dependable Computing, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2022-10-CPSY-DC-ARC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Don't Care Filling Algorithm of Control Signals for Concurrent Testing |
| Sub Title (in English) | |
| Keyword(1) | control signals |
| Keyword(2) | don't care filling |
| Keyword(3) | concurrent testing |
| Keyword(4) | data-paths |
| Keyword(5) | heuristic algorithm |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Xu Haofeng |
| 1st Author's Affiliation | Nihon University (Nihon Univ.) |
| 2nd Author's Name | Hosokawa Toshinori |
| 2nd Author's Affiliation | Nihon University (Nihon Univ.) |
| 3rd Author's Name | Yoshimura Masayoshi |
| 3rd Author's Affiliation | Kyoto Sangyo University (KSU) |
| 4th Author's Name | Arai Masayuki |
| 4th Author's Affiliation | Nihon University (Nihon Univ.) |
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| Speaker | Author-1 |
| Date Time | 2022-10-12 14:00:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | CPSY2022-24, DC2022-24 |
| Volume (vol) | vol.122 |
| Number (no) | no.204(CPSY), no.205(DC) |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2022-10-04 (CPSY, DC) |
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