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Paper Abstract and Keywords
Presentation 2022-10-14 09:50
Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI
Seiya Takano, Shugo Kaji (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-53 MW2022-99 EST2022-63
Abstract (in Japanese) (See Japanese page) 
(in English) The threats of electromagnetic (EM) information leakage induced by low-power intentional EM interference have been reported. A leakage frequency estimation method has been proposed, focusing on the frequency characteristic of the digital IC's input impedance, which is one of the factors inducing EM information leakage. However, the method only applies to the IC that output states are controllable. This paper shows an evaluation system that can measure changes in the input impedance of ICs, which is difficult to control the output states. In the experiment, two types of D-class audio amplifier ICs were targeted, and we measured the input impedance changes according to the output states.
Keyword (in Japanese) (See Japanese page) 
(in English) EM Information Leakage / TEMPEST / IEMI / / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 206, EMCJ2022-53, pp. 93-96, Oct. 2022.
Paper # EMCJ2022-53 
Date of Issue 2022-10-06 (EMCJ, MW, EST) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2022-53 MW2022-99 EST2022-63

Conference Information
Committee EMCJ MW EST IEE-EMC  
Conference Date 2022-10-13 - 2022-10-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Akita University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2022-10-EMCJ-MW-EST-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI 
Sub Title (in English)  
Keyword(1) EM Information Leakage  
Keyword(2) TEMPEST  
Keyword(3) IEMI  
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Keyword(8)  
1st Author's Name Seiya Takano  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Shugo Kaji  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Masahiro Kinugawa  
3rd Author's Affiliation The University of Fukuchiyama (Univ. of Fukuchiyama)
4th Author's Name Daisuke Fujimoto  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
5th Author's Name Yuichi Hayashi  
5th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2022-10-14 09:50:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2022-53, MW2022-99, EST2022-63 
Volume (vol) vol.122 
Number (no) no.206(EMCJ), no.207(MW), no.208(EST) 
Page pp.93-96 
#Pages 4 
Date of Issue 2022-10-06 (EMCJ, MW, EST) 

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