Paper Abstract and Keywords |
Presentation |
2022-12-16 13:10
On Improving the Accuracy of LSI Small Delay Fault Diagnosis Shinnosuke Fujita, Stefan Holst, Xiaoqing Wen (Kyutech) DC2022-72 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
With today's tight timing margins, increasing manufacturing variation, and the development of nanometer technology, timing-related defects have become a major concern in the development of LSI technology. Therefore, detailed information on SDD (Small Delay Defect) is needed. In addition, variations in the delay values of each element in LSI manufacturing have come to affect circuits. Therefore, it is necessary to perform fault diagnosis taking the variations into account. In this study, we propose a diagnostic algorithm specifically designed to diagnose timing problems under compressed test responses and process variations. We report the results of the algorithm with a new process for the case of a large number of SDD candidates that were not diagnosed. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Small Delay Defect / Delay Fault / Fault Diagnosis / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 122, no. 318, DC2022-72, pp. 1-6, Dec. 2022. |
Paper # |
DC2022-72 |
Date of Issue |
2022-12-09 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2022-72 |
Conference Information |
Committee |
DC |
Conference Date |
2022-12-16 - 2022-12-16 |
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(See Japanese page) |
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(See Japanese page) |
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Safety, etc. |
Paper Information |
Registration To |
DC |
Conference Code |
2022-12-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
On Improving the Accuracy of LSI Small Delay Fault Diagnosis |
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Keyword(1) |
Small Delay Defect |
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Delay Fault |
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Fault Diagnosis |
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1st Author's Name |
Shinnosuke Fujita |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
2nd Author's Name |
Stefan Holst |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
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Xiaoqing Wen |
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Kyushu Institute of Technology (Kyutech) |
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Speaker |
Author-1 |
Date Time |
2022-12-16 13:10:00 |
Presentation Time |
20 minutes |
Registration for |
DC |
Paper # |
DC2022-72 |
Volume (vol) |
vol.122 |
Number (no) |
no.318 |
Page |
pp.1-6 |
#Pages |
6 |
Date of Issue |
2022-12-09 (DC) |
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