IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2022-12-16 13:10
On Improving the Accuracy of LSI Small Delay Fault Diagnosis
Shinnosuke Fujita, Stefan Holst, Xiaoqing Wen (Kyutech) DC2022-72
Abstract (in Japanese) (See Japanese page) 
(in English) With today's tight timing margins, increasing manufacturing variation, and the development of nanometer technology, timing-related defects have become a major concern in the development of LSI technology. Therefore, detailed information on SDD (Small Delay Defect) is needed. In addition, variations in the delay values of each element in LSI manufacturing have come to affect circuits. Therefore, it is necessary to perform fault diagnosis taking the variations into account. In this study, we propose a diagnostic algorithm specifically designed to diagnose timing problems under compressed test responses and process variations. We report the results of the algorithm with a new process for the case of a large number of SDD candidates that were not diagnosed.
Keyword (in Japanese) (See Japanese page) 
(in English) Small Delay Defect / Delay Fault / Fault Diagnosis / / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 318, DC2022-72, pp. 1-6, Dec. 2022.
Paper # DC2022-72 
Date of Issue 2022-12-09 (DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2022-72

Conference Information
Committee DC  
Conference Date 2022-12-16 - 2022-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Safety, etc. 
Paper Information
Registration To DC 
Conference Code 2022-12-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On Improving the Accuracy of LSI Small Delay Fault Diagnosis 
Sub Title (in English)  
Keyword(1) Small Delay Defect  
Keyword(2) Delay Fault  
Keyword(3) Fault Diagnosis  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shinnosuke Fujita  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Stefan Holst  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name Xiaoqing Wen  
3rd Author's Affiliation Kyushu Institute of Technology (Kyutech)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2022-12-16 13:10:00 
Presentation Time 20 minutes 
Registration for DC 
Paper # DC2022-72 
Volume (vol) vol.122 
Number (no) no.318 
Page pp.1-6 
#Pages
Date of Issue 2022-12-09 (DC) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan