| 講演抄録/キーワード |
| 講演名 |
2023-05-19 17:20
AlN film by reactive sputtering as a stressor for Ge photonic devices on Si ○Jose A. Piedra-Lorenzana・Shohei Kaneko・Takaaki Fukushima・Keisuke Yamane(Toyohashi Univ. Tec.)・Junichi Fujikata(Tokushima Univ.)・Yasuhiko Ishikawa(Toyohashi Univ. Tec.) ED2023-9 CPM2023-9 SDM2023-26 |
| 抄録 |
(和) |
(まだ登録されていません) |
| (英) |
AlN deposited by reactive sputtering is studied as an external stressor for controlling the operating wavelength of near-infrared photonic devices with a Ge epitaxial layer on Si. A Ge strip structure as narrow as 1 μm is prepared by selective-area chemical vapor deposition on Si with a SiO2 mask, followed by a deposition of a poly-crystalline AlN overlayer by reactive sputtering at a low temperature of 200C. The Raman spectrum indicates a tensile strain generated by depositing the AlN film on the Ge strip. Such a tensile strain narrows the direct bandgap energy of Ge, as confirmed by the photoluminescence spectroscopy. The fundamental optical absorption edge is potentially extended longer than the wavelength of 1.55 μm in the unstrained case. |
| キーワード |
(和) |
/ / / / / / / |
| (英) |
Ge / Stressor / AlN / Si photonics / / / / |
| 文献情報 |
信学技報, vol. 123, no. 43, SDM2023-26, pp. 36-39, 2023年5月. |
| 資料番号 |
SDM2023-26 |
| 発行日 |
2023-05-12 (ED, CPM, SDM) |
| ISSN |
Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
| PDFダウンロード |
ED2023-9 CPM2023-9 SDM2023-26 |