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Paper Abstract and Keywords
Presentation 2023-07-06 10:40
Autoencoder Based Incremental LSI Test Escape Detection Using Transfer Learning
Ayano Takaya, Michihiro Shintani (KIT) CAS2023-4 VLD2023-4 SIP2023-20 MSS2023-4
Abstract (in Japanese) (See Japanese page) 
(in English) Machine-learning-based test escape detection is gaining attention as a novel approach for detecting faulty large-scale integrated circuits (LSIs) that traditional methods fail to detect. In such scenarios, a model is developed by learning a significant amount of data from the LSI test results and used to test the manufactured LSIs.However, because manufactured LSIs are subject to lot management, the data used for learning are transmitted sequentially, necessitating restarting the learning process from the beginning at each manufacturing stage when new data arrive, leading to prolonged learning times. In this study, we propose a novel test escape detection method utilizing a transfer learning technique that reduces learning times while preserving test accuracy by learning the data of newly manufactured LSIs while maintaining the previously learned model.
Evaluations utilizing the LSI production test data indicated that the proposed method can decrease the learning time by more than 40.40% without compromising the test accuracy.
Keyword (in Japanese) (See Japanese page) 
(in English) Neural network / Test escape detection / Transfer learning / Incremental learning / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 98, VLD2023-4, pp. 16-21, July 2023.
Paper # VLD2023-4 
Date of Issue 2023-06-29 (CAS, VLD, SIP, MSS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CAS2023-4 VLD2023-4 SIP2023-20 MSS2023-4

Conference Information
Committee MSS CAS SIP VLD  
Conference Date 2023-07-06 - 2023-07-07 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2023-07-MSS-CAS-SIP-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Autoencoder Based Incremental LSI Test Escape Detection Using Transfer Learning 
Sub Title (in English)  
Keyword(1) Neural network  
Keyword(2) Test escape detection  
Keyword(3) Transfer learning  
Keyword(4) Incremental learning  
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1st Author's Name Ayano Takaya  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Michihiro Shintani  
2nd Author's Affiliation Kyoto Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2023-07-06 10:40:00 
Presentation Time 20 minutes 
Registration for VLD 
Paper # CAS2023-4, VLD2023-4, SIP2023-20, MSS2023-4 
Volume (vol) vol.123 
Number (no) no.97(CAS), no.98(VLD), no.99(SIP), no.100(MSS) 
Page pp.16-21 
#Pages 6 
Date of Issue 2023-06-29 (CAS, VLD, SIP, MSS) 

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