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Paper Abstract and Keywords
Presentation 2023-09-08 13:50
Active Testing for Machine Learning Model Using Level Set Estimation
Takuma Ochiai, Keiichiro Seno, Kota Matsui (Nagoya Univ.), Satoshi Hara (Osaka Univ.) IBISML2023-29
Abstract (in Japanese) (See Japanese page) 
(in English) In this study, we propose a method for estimating the test loss in binary classification model with minimal labeling of the test data. The central idea of the proposed method is to reduce the problem of test loss estimation to the problem of level set estimation for the loss function. This reduction allows us to achieve sequential test loss estimation through iterative labeling using active learning methods for level set estimation. Through multiple dataset experiments, we confirmed that the proposed method is effective for evaluating binary classification models and allows for test loss estimation with fewer labeled samples compared to existing methods.
Keyword (in Japanese) (See Japanese page) 
(in English) Level Set Estimation / Active Testing / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 186, IBISML2023-29, pp. 22-26, Sept. 2023.
Paper # IBISML2023-29 
Date of Issue 2023-09-01 (IBISML) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IBISML2023-29

Conference Information
Committee IBISML  
Conference Date 2023-09-08 - 2023-09-08 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Metropolitan University (Nakamozu Campus) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Machine Learning, etc. 
Paper Information
Registration To IBISML 
Conference Code 2023-09-IBISML 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Active Testing for Machine Learning Model Using Level Set Estimation 
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Keyword(1) Level Set Estimation  
Keyword(2) Active Testing  
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1st Author's Name Takuma Ochiai  
1st Author's Affiliation Nagoya University (Nagoya Univ.)
2nd Author's Name Keiichiro Seno  
2nd Author's Affiliation Nagoya University (Nagoya Univ.)
3rd Author's Name Kota Matsui  
3rd Author's Affiliation Nagoya University (Nagoya Univ.)
4th Author's Name Satoshi Hara  
4th Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2023-09-08 13:50:00 
Presentation Time 25 minutes 
Registration for IBISML 
Paper # IBISML2023-29 
Volume (vol) vol.123 
Number (no) no.186 
Page pp.22-26 
#Pages 5 
Date of Issue 2023-09-01 (IBISML) 

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