IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2023-10-31 13:25
Fabrication of Superconducting Tunnel Junction X-ray Detector in Qufab
Tsuyoshi Noguchi (Saitama univ./AIST), Go Fujii (AIST), Tohru Taino (Saitama univ.) SCE2023-20
Abstract (in Japanese) (See Japanese page) 
(in English) Superconducting tunnel junction (STJ) detectors can theoretically achieve several ten times higher energy resolution than conventional semiconductor detectors and are expected to be applied to X-ray fluorescence analysis of trace amounts of light elements and other elements in next-generation energy semiconductors such as SiC and GaN. We have been fabricating superconducting tunnel junctions (STJs) at the CRAVITY facility of the National Institute of Advanced Industrial Science and Technology (AIST). In order to develop large-scale superconducting quantum computing devices, about half of the equipment in the facility will be replaced from the fall of 2021 to the spring of 2022. accordingly, The name was changed to Superconducting Quantum Circuit Fabrication Facility (Qufab). In this presentation, we will report the results of our attempt to fabricate STJs at Qufab and the performance evaluation of the STJs.
Keyword (in Japanese) (See Japanese page) 
(in English) Superconducting X-ray detector / Superconducting tunnel junction detector / STJ detector / Qufab / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 234, SCE2023-20, pp. 40-43, Oct. 2023.
Paper # SCE2023-20 
Date of Issue 2023-10-23 (SCE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2023-20

Conference Information
Committee SCE  
Conference Date 2023-10-30 - 2023-10-31 
Place (in Japanese) (See Japanese page) 
Place (in English) RIEC, Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Superconducting Electronics 
Paper Information
Registration To SCE 
Conference Code 2023-10-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fabrication of Superconducting Tunnel Junction X-ray Detector in Qufab 
Sub Title (in English)  
Keyword(1) Superconducting X-ray detector  
Keyword(2) Superconducting tunnel junction detector  
Keyword(3) STJ detector  
Keyword(4) Qufab  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Tsuyoshi Noguchi  
1st Author's Affiliation Saitama university/Advanced Industrial Science and Technology (Saitama univ./AIST)
2nd Author's Name Go Fujii  
2nd Author's Affiliation Advanced Industrial Science and Technology (AIST)
3rd Author's Name Tohru Taino  
3rd Author's Affiliation Saitama university (Saitama univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2023-10-31 13:25:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2023-20 
Volume (vol) vol.123 
Number (no) no.234 
Page pp.40-43 
#Pages
Date of Issue 2023-10-23 (SCE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan