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Paper Abstract and Keywords
Presentation 2023-11-17 10:00
Derivation of secret keys by differential fault analysis using backside voltage fault injection
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67
Abstract (in Japanese) (See Japanese page) 
(in English) Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (IC) chips. However, lasers present a challenge in terms of attack cost. Therefore, we focused on the voltage pulse to the backside of the chip, which is a disturbance injection method with lower attack cost compared to the laser, and actually performed fault injection on a cryptographic IC chip. Then, we performed differential fault analysis (DFA) using the fault ciphertext obtained by fault injection and succeeded in deriving the secret key.
Keyword (in Japanese) (See Japanese page) 
(in English) AES / fault injection attack / DFA / backside voltage fault injection / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 259, ICD2023-72, pp. 178-181, Nov. 2023.
Paper # ICD2023-72 
Date of Issue 2023-11-08 (VLD, ICD, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67

Conference Information
Committee VLD DC RECONF ICD IPSJ-SLDM  
Conference Date 2023-11-15 - 2023-11-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Civic Auditorium Sears Home Yume Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2023 -New Field of VLSI Design- 
Paper Information
Registration To ICD 
Conference Code 2023-11-VLD-DC-RECONF-ICD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Derivation of secret keys by differential fault analysis using backside voltage fault injection 
Sub Title (in English)  
Keyword(1) AES  
Keyword(2) fault injection attack  
Keyword(3) DFA  
Keyword(4) backside voltage fault injection  
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1st Author's Name Yusuke Hayashi  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Rikuu Hasegawa  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Takuya Wadatsumi  
3rd Author's Affiliation Kobe University (Kobe Univ.)
4th Author's Name Kazuki Monta  
4th Author's Affiliation Kobe University (Kobe Univ.)
5th Author's Name Takuji Miki  
5th Author's Affiliation Kobe University (Kobe Univ.)
6th Author's Name Makoto Nagata  
6th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2023-11-17 10:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # VLD2023-64, ICD2023-72, DC2023-71, RECONF2023-67 
Volume (vol) vol.123 
Number (no) no.258(VLD), no.259(ICD), no.260(DC), no.261(RECONF) 
Page pp.178-181 
#Pages 4 
Date of Issue 2023-11-08 (VLD, ICD, DC, RECONF) 

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