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Paper Abstract and Keywords
Presentation 2023-12-01 09:55
Simultaneous microscopic PA/PL line-scan measurements in InGaN-quantum wells on a stripe-core GaN Substrate
Syoki Jinno, Atsushi A. Yamaguchi, Keito Mori-Tamamura (Kanazawa Inst. of Tech.), Susumu Kusanagi, Yuya Kanitani, Shigetaka Tomiya, Yoshihiro Kudo (Sony Semiconductor Solutions Corp.) ED2023-25 CPM2023-67 LQE2023-65
Abstract (in Japanese) (See Japanese page) 
(in English) Accurate measurement of internal quantum efficiency (IQE) is necessary for a comprehensive understanding of the electronic structures and carrier dynamics in InGaN quantum-well emitting layers, and we have proposed simultaneous photoacoustic (PA) and photoluminescence (PL) measurements for such accurate IQE estimation. In this study, we have performed line-scan measurements of the simultaneous PA and PL measurements for InGaN quantum wells on a stripe-core GaN substrate, where the defect density spatially varies significantly. The results show that the PA and PL signal intensities show complemental relationship, which is quite reasonable. However, the data are affected by substrate absorption of the excitation light, and such effects should be removed to estimate accurate IQE values from the measurement data
Keyword (in Japanese) (See Japanese page) 
(in English) InGaN Quantum Well / Simultaneous photoacoustic / Photoluminescence measurements / Internal quantum efficiency / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 290, LQE2023-65, pp. 52-55, Nov. 2023.
Paper # LQE2023-65 
Date of Issue 2023-11-23 (ED, CPM, LQE) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2023-25 CPM2023-67 LQE2023-65

Conference Information
Committee LQE ED CPM  
Conference Date 2023-11-30 - 2023-12-01 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To LQE 
Conference Code 2023-11-LQE-ED-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Simultaneous microscopic PA/PL line-scan measurements in InGaN-quantum wells on a stripe-core GaN Substrate 
Sub Title (in English)  
Keyword(1) InGaN Quantum Well  
Keyword(2) Simultaneous photoacoustic  
Keyword(3) Photoluminescence measurements  
Keyword(4) Internal quantum efficiency  
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1st Author's Name Syoki Jinno  
1st Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. of Tech.)
2nd Author's Name Atsushi A. Yamaguchi  
2nd Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. of Tech.)
3rd Author's Name Keito Mori-Tamamura  
3rd Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. of Tech.)
4th Author's Name Susumu Kusanagi  
4th Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions Corp.)
5th Author's Name Yuya Kanitani  
5th Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions Corp.)
6th Author's Name Shigetaka Tomiya  
6th Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions Corp.)
7th Author's Name Yoshihiro Kudo  
7th Author's Affiliation Sony Semiconductor Solutions Corporation (Sony Semiconductor Solutions Corp.)
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Speaker Author-1 
Date Time 2023-12-01 09:55:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # ED2023-25, CPM2023-67, LQE2023-65 
Volume (vol) vol.123 
Number (no) no.288(ED), no.289(CPM), no.290(LQE) 
Page pp.52-55 
#Pages 4 
Date of Issue 2023-11-23 (ED, CPM, LQE) 

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