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Paper Abstract and Keywords
Presentation 2024-02-21 10:45
[Invited Talk] Development of Superconducting Nb Interconnects for Low-Temperature SoC for Qubit Control
Hideaki Numata, Noriyuki Iguchi (NBS), Masamitsu Tanaka (Nagoya Univ.), Koichiro Okamoto, Sadahiko Miura (NBS), Ken Uchida (UTokyo), Hiroki Ishikuro (Keio Univ.), Toshitsugu Sakamoto, Munehiro Tada (NBS) SDM2023-82
Abstract (in Japanese) (See Japanese page) 
(in English) A 100 nm wide superconducting Nb interconnects were fabricated by a 300-mm wafer process for low temperature SoC applications. A low pressure and long throw sputtering was adopted for the Nb deposition, resulting in good superconductivity of the 50 nm thick Nb film with a critical temperature (Tc) of 8.3 K. The interconnects had a TiN/Nb stack structure, and a double layer hard mask was used for dry etching process. The 25 nm TiN layer well protected the Nb film from plasma damage during the fabrication, then the developed 100 nm wide Nb interconnect showed good superconductivity with a Tc of 7.8 K and a critical current of 3.2 mA at 4.2 K.
Keyword (in Japanese) (See Japanese page) 
(in English) Superconductor / Nb / Interconnect / Dry Etching / Cryo-CMOS / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 385, SDM2023-82, pp. 4-8, Feb. 2024.
Paper # SDM2023-82 
Date of Issue 2024-02-14 (SDM) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SDM  
Conference Date 2024-02-21 - 2024-02-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo University-Hongo-Engineering Bldg.4 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SDM 
Conference Code 2024-02-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of Superconducting Nb Interconnects for Low-Temperature SoC for Qubit Control 
Sub Title (in English)  
Keyword(1) Superconductor  
Keyword(2) Nb  
Keyword(3) Interconnect  
Keyword(4) Dry Etching  
Keyword(5) Cryo-CMOS  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hideaki Numata  
1st Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
2nd Author's Name Noriyuki Iguchi  
2nd Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
3rd Author's Name Masamitsu Tanaka  
3rd Author's Affiliation Nagoya University (Nagoya Univ.)
4th Author's Name Koichiro Okamoto  
4th Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
5th Author's Name Sadahiko Miura  
5th Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
6th Author's Name Ken Uchida  
6th Author's Affiliation The University of Tokyo (UTokyo)
7th Author's Name Hiroki Ishikuro  
7th Author's Affiliation Keio University (Keio Univ.)
8th Author's Name Toshitsugu Sakamoto  
8th Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
9th Author's Name Munehiro Tada  
9th Author's Affiliation NanoBridge Semiconductor, Inc. (NBS)
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Speaker Author-1 
Date Time 2024-02-21 10:45:00 
Presentation Time 40 minutes 
Registration for SDM 
Paper # SDM2023-82 
Volume (vol) vol.123 
Number (no) no.385 
Page pp.4-8 
#Pages
Date of Issue 2024-02-14 (SDM) 


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