Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-02-29 15:30
[Memorial Lecture] Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits
Kunihiro Oshima (Kyoto Univ.), Kazunori Kuribara (AIST), Takashi Sato (Kyoto Univ.) VLD2023-116 HWS2023-76 ICD2023-105
Abstract (in Japanese) (See Japanese page) 
(in English) We enhance the robustness of organic thin-film transistor (OTFT)-based physically unclonable functions (PUFs) against unstable output responses that originate from OTFT characteristic degradation. The proposed PUF incorporates a new resistive random access memory (ReRAM) constructed from metal-oxide thin films, enabling both ReRAM and OTFT components to be simultaneously fabricated using common materials and processes. The device combinations facilitate the efficient design of clonable PUF (CPUF) circuits with equivalent response outputs. Evaluations using measurements and simulations validate the successful operation of the CPUF.
Keyword (in Japanese) (See Japanese page) 
(in English) Organic thin-film transistor (OTFT) / Physically unclonable function (PUF) / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 390, VLD2023-116, pp. 98-98, Feb. 2024.
Paper # VLD2023-116 
Date of Issue 2024-02-21 (VLD, HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2023-116 HWS2023-76 ICD2023-105

Conference Information
Committee VLD HWS ICD  
Conference Date 2024-02-28 - 2024-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To VLD 
Conference Code 2024-02-VLD-HWS-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits 
Sub Title (in English)  
Keyword(1) Organic thin-film transistor (OTFT)  
Keyword(2) Physically unclonable function (PUF)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kunihiro Oshima  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Kazunori Kuribara  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Takashi Sato  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2024-02-29 15:30:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2023-116, HWS2023-76, ICD2023-105 
Volume (vol) vol.123 
Number (no) no.390(VLD), no.391(HWS), no.392(ICD) 
Page p.98 
#Pages 1 
Date of Issue 2024-02-21 (VLD, HWS, ICD) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan