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Paper Abstract and Keywords
Presentation 2024-06-28 09:45
Far-field radiation field strength simulations based on electronic equipment design data
Akihiro Tanaka, Shuhei Nozue, Hiroyuki Motoki, Hideyuki Nakanishi (RITA Electronics), Koichi Nakahashi, Naoya Iisaka, Junichi Komiya (Tokyo Drawing) EMCJ2024-9
Abstract (in Japanese) (See Japanese page) 
(in English) This study investigates the feasibility of simulating far-field radiated electric field intensity (radiated noise) based on the design data of electronic devices. Design, fabrication, and measurement confirmed that the design of the board and the presence of an enclosure affect radiated noise. Electromagnetic field analysis using the finite element method was performed on four conditions, requiring data simplification to approximately 2 to 2.6 million meshes. Calculations for four frequencies between 120 to 192 MHz took 4 to 7 hours. The causes of discrepancies between the simulation and actual measurements were also examined.
Keyword (in Japanese) (See Japanese page) 
(in English) Electronic equipment / Design data / Far-field radiated emission intensity / Finite element method / Electromagnetic field analysis / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 92, EMCJ2024-9, pp. 11-16, June 2024.
Paper # EMCJ2024-9 
Date of Issue 2024-06-21 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2024-9

Conference Information
Committee EMCJ IEE-EMC IEE-SPC  
Conference Date 2024-06-28 - 2024-06-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Hotel Suncity 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC 
Paper Information
Registration To EMCJ 
Conference Code 2024-06-EMCJ-EMC-SPC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Far-field radiation field strength simulations based on electronic equipment design data 
Sub Title (in English)  
Keyword(1) Electronic equipment  
Keyword(2) Design data  
Keyword(3) Far-field radiated emission intensity  
Keyword(4) Finite element method  
Keyword(5) Electromagnetic field analysis  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Akihiro Tanaka  
1st Author's Affiliation RITA Electronics, Ltd. (RITA Electronics)
2nd Author's Name Shuhei Nozue  
2nd Author's Affiliation RITA Electronics, Ltd. (RITA Electronics)
3rd Author's Name Hiroyuki Motoki  
3rd Author's Affiliation RITA Electronics, Ltd. (RITA Electronics)
4th Author's Name Hideyuki Nakanishi  
4th Author's Affiliation RITA Electronics, Ltd. (RITA Electronics)
5th Author's Name Koichi Nakahashi  
5th Author's Affiliation Tokyo Drawing, Ltd. (Tokyo Drawing)
6th Author's Name Naoya Iisaka  
6th Author's Affiliation Tokyo Drawing, Ltd. (Tokyo Drawing)
7th Author's Name Junichi Komiya  
7th Author's Affiliation Tokyo Drawing, Ltd. (Tokyo Drawing)
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Speaker Author-1 
Date Time 2024-06-28 09:45:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2024-9 
Volume (vol) vol.124 
Number (no) no.92 
Page pp.11-16 
#Pages 6 
Date of Issue 2024-06-21 (EMCJ) 

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