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Paper Abstract and Keywords
Presentation 2024-07-18 14:00
Measurement of Leakage based Strong PUF Operating at Ultra Low Voltage Using a Leakage Control Approach
Shunkichi Hata, Kimiyoshi Usami (SIT) CAS2024-8 VLD2024-8 SIP2024-25 MSS2024-8
Abstract (in Japanese) (See Japanese page) 
(in English) Low voltage operation becomes issues to be addressed when PUF (Physically Unclonable Function) is mounted on devices that use energy harvesting as a power source. LRPUF (Leak Racing PUF) was proposed as a leakage based strong PUF. However approaches to make it operate at ultra-low voltage have not been reported with a proof of working in real silicon. In this paper, we propose a technique to make LRPUF operate at ultra-low voltage by the voltage for leakage control (VLC). We implemented a test chip and fabricated in a 180nm CMOS bulk process. We show the measured results of the quality of PUF and energy with test chip.
Keyword (in Japanese) (See Japanese page) 
(in English) PUF / Security / Leakage Current / Manufacturing Variability / Ultra-Low Voltage / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 111, VLD2024-8, pp. 41-46, July 2024.
Paper # VLD2024-8 
Date of Issue 2024-07-11 (CAS, VLD, SIP, MSS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CAS2024-8 VLD2024-8 SIP2024-25 MSS2024-8

Conference Information
Committee VLD CAS SIP MSS  
Conference Date 2024-07-18 - 2024-07-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To VLD 
Conference Code 2024-07-VLD-CAS-SIP-MSS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement of Leakage based Strong PUF Operating at Ultra Low Voltage Using a Leakage Control Approach 
Sub Title (in English)  
Keyword(1) PUF  
Keyword(2) Security  
Keyword(3) Leakage Current  
Keyword(4) Manufacturing Variability  
Keyword(5) Ultra-Low Voltage  
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Keyword(7)  
Keyword(8)  
1st Author's Name Shunkichi Hata  
1st Author's Affiliation Shibaura Institute of Technology (SIT)
2nd Author's Name Kimiyoshi Usami  
2nd Author's Affiliation Shibaura Institute of Technology (SIT)
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Speaker Author-1 
Date Time 2024-07-18 14:00:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # CAS2024-8, VLD2024-8, SIP2024-25, MSS2024-8 
Volume (vol) vol.124 
Number (no) no.110(CAS), no.111(VLD), no.112(SIP), no.113(MSS) 
Page pp.41-46 
#Pages 6 
Date of Issue 2024-07-11 (CAS, VLD, SIP, MSS) 

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