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Paper Abstract and Keywords
Presentation 2024-07-18 15:10
Study on immunity performance equivalence of semiconductor products considering manufacturing variations
Hidetake Sugo, Norimasa Oka, Takeshi Matsuzaki (DENSO CORP.) EMCJ2024-28
Abstract (in Japanese) (See Japanese page) 
(in English) In this study, we analyzed an effect of an immunity performance for a semiconductor product with differential amplifier by manufacturing variations. By a multivariate analysis whose objective variables are several DPI measurement results obtained beforehand and whose explanatory variables are various parameters that will affect immunity performance, it becomes apparent that some parameters related frequencies and amplitude gains have a large contribution to the performance. The maximum difference among samples with different oscillation frequency is 8.7 dB. We validated a hypothesis that the difference is coursed by under sampling of conducted disturbance noise and confirmed the minimum power that coursed failure can be estimated with range of manufacturing variation. In order to confirm the immunity performance equivalence certainly, it is concluded that identifying key parameter and selection of suitable samples are most important.
Keyword (in Japanese) (See Japanese page) 
(in English) Conducted Immunity / DPI method / Semiconductor / Differential amplifier / Multivariate analysis / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 114, EMCJ2024-28, pp. 34-39, July 2024.
Paper # EMCJ2024-28 
Date of Issue 2024-07-11 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2024-28

Conference Information
Committee EMCJ  
Conference Date 2024-07-18 - 2024-07-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientist Meeting 
Paper Information
Registration To EMCJ 
Conference Code 2024-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on immunity performance equivalence of semiconductor products considering manufacturing variations 
Sub Title (in English)  
Keyword(1) Conducted Immunity  
Keyword(2) DPI method  
Keyword(3) Semiconductor  
Keyword(4) Differential amplifier  
Keyword(5) Multivariate analysis  
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Keyword(7)  
Keyword(8)  
1st Author's Name Hidetake Sugo  
1st Author's Affiliation DENSO CORPORATION (DENSO CORP.)
2nd Author's Name Norimasa Oka  
2nd Author's Affiliation DENSO CORPORATION (DENSO CORP.)
3rd Author's Name Takeshi Matsuzaki  
3rd Author's Affiliation DENSO CORPORATION (DENSO CORP.)
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Speaker Author-1 
Date Time 2024-07-18 15:10:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2024-28 
Volume (vol) vol.124 
Number (no) no.114 
Page pp.34-39 
#Pages 6 
Date of Issue 2024-07-11 (EMCJ) 

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