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Paper Abstract and Keywords
Presentation 2024-08-30 14:05
Diagnosis of a negative estimated parameter on a Riccati model
Daisuke Satoh (FIT) R2024-26 EMD2024-20 CPM2024-36 OPE2024-76 LQE2024-23
Abstract (in Japanese) (See Japanese page) 
(in English) A negative parameter can be estimated on an inflection S-shaped software reliability growth model in software reliability engineering and the Bass model in new product diffusion models although the parameter must be positive on these models. These models are described as Riccati equations. The exact solutions of the Riccati equations show S-shaped curves. Two causes of the negative parameter are supposed. The models does not suppose to meet actual data when the negative parameter is estimated. Or noise included in actual data supposes to affect the negative parameter estimation. The latter cause is focused in this paper. Analyses in this paper revealed that the negative parameter is estimated when actual data include many local convex upward data in the early phase.
Keyword (in Japanese) (See Japanese page) 
(in English) Inflection S-shaped software reliability growth model / Inflection S-shaped software reliability growth model, Riccati equation / difference equation / exact solution / multicollinearity / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 167, R2024-26, pp. 67-70, Aug. 2024.
Paper # R2024-26 
Date of Issue 2024-08-22 (R, EMD, CPM, OPE, LQE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2024-26 EMD2024-20 CPM2024-36 OPE2024-76 LQE2024-23

Conference Information
Committee CPM LQE OPE EMD R  
Conference Date 2024-08-29 - 2024-08-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Hirosaki University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Photodetectors, Modulators, Optical Electrical device packaging and reliability 
Paper Information
Registration To R 
Conference Code 2024-08-CPM-LQE-OPE-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Diagnosis of a negative estimated parameter on a Riccati model 
Sub Title (in English)  
Keyword(1) Inflection S-shaped software reliability growth model  
Keyword(2) Inflection S-shaped software reliability growth model, Riccati equation  
Keyword(3) difference equation  
Keyword(4) exact solution  
Keyword(5) multicollinearity  
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1st Author's Name Daisuke Satoh  
1st Author's Affiliation Fukuoka Institute of Technology (FIT)
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Speaker Author-1 
Date Time 2024-08-30 14:05:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2024-26, EMD2024-20, CPM2024-36, OPE2024-76, LQE2024-23 
Volume (vol) vol.124 
Number (no) no.167(R), no.168(EMD), no.169(CPM), no.170(OPE), no.171(LQE) 
Page pp.67-70 
#Pages 4 
Date of Issue 2024-08-22 (R, EMD, CPM, OPE, LQE) 

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