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| Presentation | 2025-01-29 14:50 [Invited Talk] Clarifying the Physical Origin of Long-period Electrical Instability in Silicon Fin-type Quantum Dots Hiroshi Oka, Hidehiro Asai, Kimihiko Kato, Takumi Inaba, Shunsuke Shitakata, Shota Iizuka, Yusuke Chiashi, Yuika Kobayashi, Hitoshi Yui, Shoko Nagano, Shigenori Murakami, Yoshihisa Iba, Minoru Ogura, Takashi Nakayama, Koike Hanpei, Hiroshi Fuketa (AIST), Satoshi Moriyama (TDU), Takahiro Mori (AIST)  SDM2024-68 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | To realize highly integrated quantum computers, various types of solid-state qubits have been developed. In particular, Si spin qubits have an advantage in scalability due to its CMOS-compatible manufacturing technology. Recently, the performance of Si spin qubits has been developed steadily such as prolonged coherence time and improved operation fidelity. In addition to improving the performance of Si spin qubits, long-period electrical stability is also an important factor for the practical operation of quantum computers, which directly leads to error amplification. However, there are only limited reports on the long-period electrical stability of the Si spin qubits and its origin has not been thoroughly discussed so far. In this study, we characterized the long-period random telegraph noise (RTN) in fin-type Si quantum dots and clarified its physical origin for the first time. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Quantum computer / Si qubits / Fin-type quantum dots / Electrical stability / RTN / Band-edge states / / | |
| Reference Info. | IEICE Tech. Rep., vol. 124, no. 367, SDM2024-68, pp. 11-14, Jan. 2025. | |
| Paper # | SDM2024-68 | |
| Date of Issue | 2025-01-22 (SDM) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2024-68 |
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| Conference Information | |
| Committee | SDM |
| Conference Date | 2025-01-29 - 2025-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | KIT Toranomon Graduate School |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Advanced semiconductor devices and processes (Special feature on IEDM) |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2025-01-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Clarifying the Physical Origin of Long-period Electrical Instability in Silicon Fin-type Quantum Dots |
| Sub Title (in English) | |
| Keyword(1) | Quantum computer |
| Keyword(2) | Si qubits |
| Keyword(3) | Fin-type quantum dots |
| Keyword(4) | Electrical stability |
| Keyword(5) | RTN |
| Keyword(6) | Band-edge states |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Hiroshi Oka |
| 1st Author's Affiliation | AIST (AIST) |
| 2nd Author's Name | Hidehiro Asai |
| 2nd Author's Affiliation | AIST (AIST) |
| 3rd Author's Name | Kimihiko Kato |
| 3rd Author's Affiliation | AIST (AIST) |
| 4th Author's Name | Takumi Inaba |
| 4th Author's Affiliation | AIST (AIST) |
| 5th Author's Name | Shunsuke Shitakata |
| 5th Author's Affiliation | AIST (AIST) |
| 6th Author's Name | Shota Iizuka |
| 6th Author's Affiliation | AIST (AIST) |
| 7th Author's Name | Yusuke Chiashi |
| 7th Author's Affiliation | AIST (AIST) |
| 8th Author's Name | Yuika Kobayashi |
| 8th Author's Affiliation | AIST (AIST) |
| 9th Author's Name | Hitoshi Yui |
| 9th Author's Affiliation | AIST (AIST) |
| 10th Author's Name | Shoko Nagano |
| 10th Author's Affiliation | AIST (AIST) |
| 11th Author's Name | Shigenori Murakami |
| 11th Author's Affiliation | AIST (AIST) |
| 12th Author's Name | Yoshihisa Iba |
| 12th Author's Affiliation | AIST (AIST) |
| 13th Author's Name | Minoru Ogura |
| 13th Author's Affiliation | AIST (AIST) |
| 14th Author's Name | Takashi Nakayama |
| 14th Author's Affiliation | AIST (AIST) |
| 15th Author's Name | Koike Hanpei |
| 15th Author's Affiliation | AIST (AIST) |
| 16th Author's Name | Hiroshi Fuketa |
| 16th Author's Affiliation | AIST (AIST) |
| 17th Author's Name | Satoshi Moriyama |
| 17th Author's Affiliation | Tokyo Denki University (TDU) |
| 18th Author's Name | Takahiro Mori |
| 18th Author's Affiliation | AIST (AIST) |
| Speaker | Author-1 |
| Date Time | 2025-01-29 14:50:00 |
| Presentation Time | 30 minutes |
| Registration for | SDM |
| Paper # | SDM2024-68 |
| Volume (vol) | vol.124 |
| Number (no) | no.367 |
| Page | pp.11-14 |
| #Pages | 4 |
| Date of Issue | 2025-01-22 (SDM) |
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