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Paper Abstract and Keywords
Presentation 2025-03-14 13:20
Local Measurement of Complex Permittivity of Planar Dielectrics by Using Millimeter Wave Focusing Beam Reflection Method
Kosei Yokosawa, Nishikata Atsuhiro (Science Tokyo) EMCJ2024-109
Abstract (in Japanese) (See Japanese page) 
(in English) Local measurement of the complex permittivity $varepsilon_r$ of a dielectric plate was performed using the millimeter-wave focused beam reflection method. An easy-to-operate one-port measurement system was established in the frequency range of 33 to 50 GHz, and the procedures of axis alignment and focusing were established. The reflection coefficients were obtained by focusing the beam on a sample attached on a reference reflector, and $varepsilon_r$ was calculated backward. The effectiveness of time gating to remove unwanted reflected waves was demonstrated. Measurements were performed using polypropylene, acrylic resin, and silicone rubber with different thicknesses to evaluate the possibility of $varepsilon_r$ measurement and spatial resolution.
Furthermore, two-dimensional measurements of samples with different dielectric materials were performed, and it was shown that it is possible to measure the relative permittivity distribution of heterogeneous dielectrics.
Keyword (in Japanese) (See Japanese page) 
(in English) Focused beam method / complex permittivity measurement / spatial resolution / local measurement / / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 436, EMCJ2024-109, pp. 30-35, March 2025.
Paper # EMCJ2024-109 
Date of Issue 2025-03-07 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ MICT  
Conference Date 2025-03-14 - 2025-03-14 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2025-03-EMCJ-MICT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Local Measurement of Complex Permittivity of Planar Dielectrics by Using Millimeter Wave Focusing Beam Reflection Method 
Sub Title (in English)  
Keyword(1) Focused beam method  
Keyword(2) complex permittivity measurement  
Keyword(3) spatial resolution  
Keyword(4) local measurement  
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1st Author's Name Kosei Yokosawa  
1st Author's Affiliation Institute of Science Tokyo (Science Tokyo)
2nd Author's Name Nishikata Atsuhiro  
2nd Author's Affiliation Institute of Science Tokyo (Science Tokyo)
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Speaker Author-1 
Date Time 2025-03-14 13:20:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2024-109 
Volume (vol) vol.124 
Number (no) no.436 
Page pp.30-35 
#Pages 6 
Date of Issue 2025-03-07 (EMCJ) 

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