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Paper Abstract and Keywords
Presentation 2025-12-04 15:10
Estimating Causes of Defective Operation in Prototype Electronic Circuit Boards Through Automated Circuit Configuration Comparison
Tetsuya Hayashi, Tsuyoshi Tanaka, Masak Endo, Kenji Terada, Shigeyoshi Ohno (PTU) R2025-52
Abstract (in Japanese) (See Japanese page) 
(in English) This study aims to digitalize the fault diagnosis process performed by instructors in engineering education. We propose a circuit diagram analysis method that automatically estimates both the presence and the causes of operational defects in electronic circuit prototype boards without requiring power activation. The causes of operational defects are categorized into three factors—disconnection, short circuit, and unexpected component output—and are inferred through comparative analyses from two perspectives: circuit structure and circuit behavior. Experimental validation using actual prototype boards demonstrated that the proposed method can accurately determine the presence of operational defects with high reliability. Furthermore, the results indicate the potential of this approach as an effective diagnostic support tool, even for circuits with complex configurations.
Keyword (in Japanese) (See Japanese page) 
(in English) Circuit prototyped boards / Defect estimation / Troubleshooting / Schematic configuration comparison / Circuit operation comparison / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 268, R2025-52, pp. 19-24, Dec. 2025.
Paper # R2025-52 
Date of Issue 2025-11-27 (R) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2025-52

Conference Information
Committee R  
Conference Date 2025-12-04 - 2025-12-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability International Standard, Maintainability, Reliability General, Safety General 
Paper Information
Registration To R 
Conference Code 2025-12-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Estimating Causes of Defective Operation in Prototype Electronic Circuit Boards Through Automated Circuit Configuration Comparison 
Sub Title (in English)  
Keyword(1) Circuit prototyped boards  
Keyword(2) Defect estimation  
Keyword(3) Troubleshooting  
Keyword(4) Schematic configuration comparison  
Keyword(5) Circuit operation comparison  
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Keyword(7)  
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1st Author's Name Tetsuya Hayashi  
1st Author's Affiliation The Polytechnic University of Japan (PTU)
2nd Author's Name Tsuyoshi Tanaka  
2nd Author's Affiliation The Polytechnic University of Japan (PTU)
3rd Author's Name Masak Endo  
3rd Author's Affiliation The Polytechnic University of Japan (PTU)
4th Author's Name Kenji Terada  
4th Author's Affiliation The Polytechnic University of Japan (PTU)
5th Author's Name Shigeyoshi Ohno  
5th Author's Affiliation The Polytechnic University of Japan (PTU)
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Speaker Author-1 
Date Time 2025-12-04 15:10:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2025-52 
Volume (vol) vol.125 
Number (no) no.268 
Page pp.19-24 
#Pages 6 
Date of Issue 2025-11-27 (R) 

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