Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2025-12-18 13:55
Simulation-Based Comparison of Calibration Pattern Robustness under Imaging Degradations
Soshi Asamura, Norishige Fukushima (NITech) IE2025-43
Abstract (in Japanese) (See Japanese page) 
(in English) In this study, we develop a unified simulation environment to systematically evaluate the influence of pattern shapes and illumination shading on camera calibration. The target patterns include asymmetric circle grids, chessboards, and triangular (deltatile) patterns. Synthetic images are generated using the same lens distortion model as OpenCV, and illumination shading can be applied in a controlled and consistent manner. For feature point detection, a high-precision blob detection method with projective and lens distortion correction is used for circle patterns, while the detection of chessboard and triangular patterns follows the high-accuracy method reported by Meta.
Experiments conducted under various tilt configurations and shading conditions reveal that illumination shading severely degrades the accuracy of circle patterns. However, applying a reshading process that estimates and compensates for the local brightness field significantly improves circle pattern detection, restoring calibration accuracy to a level that surpasses the other pattern shapes.
The proposed simulation environment enables controlled experiments that are difficult to perform with real camera captures and provides a valuable foundation for quantitatively comparing pattern designs and preprocessing methods. The results highlight the importance of considering illumination conditions and shading correction when selecting calibration patterns and designing detection pipelines.
Keyword (in Japanese) (See Japanese page) 
(in English) camera calibration / calibration patterns / reshading / feature point detection / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 304, IE2025-43, pp. 13-18, Dec. 2025.
Paper # IE2025-43 
Date of Issue 2025-12-11 (IE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IE2025-43

Conference Information
Committee IE CS  
Conference Date 2025-12-18 - 2025-12-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kaikyo Messe Shimonoseki 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image coding, Communications and streaming technologies, etc. 
Paper Information
Registration To IE 
Conference Code 2025-12-IE-CS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Simulation-Based Comparison of Calibration Pattern Robustness under Imaging Degradations 
Sub Title (in English)  
Keyword(1) camera calibration  
Keyword(2) calibration patterns  
Keyword(3) reshading  
Keyword(4) feature point detection  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Soshi Asamura  
1st Author's Affiliation Nagoya Institute of Technology (NITech)
2nd Author's Name Norishige Fukushima  
2nd Author's Affiliation Nagoya Institute of Technology (NITech)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2025-12-18 13:55:00 
Presentation Time 25 minutes 
Registration for IE 
Paper # IE2025-43 
Volume (vol) vol.125 
Number (no) no.304 
Page pp.13-18 
#Pages 6 
Date of Issue 2025-12-11 (IE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan